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International Journal of Production Research Volume 45, 2007 - Issue 10
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Original Articles

Data-reduction method for spatial data using a structured wavelet model

Myong K. Jeong Department of Industrial and Information Engineering, The University of Tennessee, Knoxville, TN 37996-0700, USACorrespondence[email protected]
,
Jye-Chyi Lu School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0205, USA
,
Weixin Zhou School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0205, USA
&
Sujit K. Ghosh Department of Statistics, North Carolina State University, Raleigh, NC 27695-8203, USA
Pages 2295-2311 | Received 01 Jan 2006, Published online: 27 Apr 2007

Citations (3)

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Yuan Wang, Yajun Mei & Kamran Paynabar. (2018) Thresholded Multivariate Principal Component Analysis for Phase I Multichannel Profile Monitoring. Technometrics 60:3, pages 360-372.
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Articles from other publishers (2)

Patrice Lajoie, Jonathan Gaudreault, Nadia Lehoux & Maha Ben Ali. (2019) A data-driven framework to deal with intrinsic variability of industrial processes: An application in the textile industry. IFAC-PapersOnLine 52:13, pages 731-736.
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Byunghoon Kim, Young-Seon Jeong, Seung Hoon Tong, In-Kap Chang & Myong-Kee Jeong. (2016) Step-Down Spatial Randomness Test for Detecting Abnormalities in DRAM Wafers with Multiple Spatial Maps. IEEE Transactions on Semiconductor Manufacturing 29:1, pages 57-65.
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