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International Journal of Production Research Volume 49, 2011 - Issue 13
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Original Articles

Online parameter estimation and run-to-run process adjustment using categorical observations

Jing Lin Department of Industrial Engineering, Tsinghua University, Beijing 100084, China
&
Kaibo Wang Department of Industrial Engineering, Tsinghua University, Beijing 100084, ChinaCorrespondence[email protected]
Pages 4103-4117 | Received 10 Sep 2009, Accepted 26 Apr 2010, Published online: 23 Sep 2010

Citations (11)

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Kai Wang, Jian Li & Fugee Tsung. (2022) Distribution inference from early-stage stationary data streams by transfer learning. IISE Transactions 54:3, pages 303-320.
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Giulio Barbato, Paolo Chiabert, Gianluca D’Antonio, Manuela De Maddis, Franco Lombardi & Suela Ruffa. (2016) Method for automatic alignment recovery of a spur gear. International Journal of Production Research 54:15, pages 4475-4486.
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Kaibo Wang, Wei Jiang & Bo Li. (2016) A spatial variable selection method for monitoring product surface. International Journal of Production Research 54:14, pages 4161-4181.
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Xinwei Deng & Ran Jin. (2015) QQ Models: Joint Modeling for Quantitative and Qualitative Quality Responses in Manufacturing Systems. Technometrics 57:3, pages 320-331.
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Fangyi He, Huiliang Xie & Kaibo Wang. (2015) Optimal setup adjustment and control of a process under ARMA disturbances. IIE Transactions 47:3, pages 230-244.
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Andi Wang, Kaibo Wang & Fugee Tsung. (2014) Statistical Surface Monitoring by Spatial-Structure Modeling. Journal of Quality Technology 46:4, pages 359-376.
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Lulu Bao, Kaibo Wang & Ran Jin. (2014) A hierarchical model for characterising spatial wafer variations. International Journal of Production Research 52:6, pages 1827-1842.
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Kaibo Wang & Jing Lin. (2013) A run-to-run control algorithm based on timely and delayed mixed-resolution information. International Journal of Production Research 51:15, pages 4704-4717.
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Kaibo Wang & Kai Han. (2013) A batch-based run-to-run process control scheme for semiconductor manufacturing. IIE Transactions 45:6, pages 658-669.
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Articles from other publishers (2)

EL Mostafa El Adel, Guillaume Graton, Mustapha Ouladsine & Jacques Pinaton. (2016) Run To Run control based on categorical output in semiconductor manufacturing. Run To Run control based on categorical output in semiconductor manufacturing.
Jun Zhang, Wei Li, Kaibo Wang & Ran Jin. (2014) Process adjustment with an asymmetric quality loss function. Journal of Manufacturing Systems 33:1, pages 159-165.
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