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International Journal of Production Research Volume 50, 2012 - Issue 14
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Original Articles

The density control chart: a general approach for constructing a single chart for simultaneously monitoring multiple parameters

Hung-Chia Chen Institute of Statistics, National Chiao Tung University, Hsinchu, Taiwan
,
Arthur B. Yeh Department of Applied Statistics and Operations Research, Bowling Green State University, Bowling Green, OH 43403, USACorrespondence[email protected]
,
Chia-Ling Yen Institute of Statistics, National Tsing Hua University, Hsinchu, Taiwan
&
Lin-An Chen Institute of Statistics, National Chiao Tung University, Hsinchu, Taiwan
Pages 3904-3919 | Received 31 May 2010, Accepted 27 Jun 2011, Published online: 23 Aug 2011

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Z. L. Chong, A. Mukherjee & Michael B. C. Khoo. (2020) Some simplified Shewhart-type distribution-free joint monitoring schemes and its application in monitoring drinking water turbidity. Quality Engineering 32:1, pages 91-110.
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Salah Haridy, Zhang Wu, Songlin Chen & Sven Knoth. (2014) Binomial CUSUM chart with curtailment. International Journal of Production Research 52:15, pages 4646-4659.
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Marcela A.G. Machado & Antonio F.B. Costa. (2014) A side-sensitive synthetic chart combined with an chart. International Journal of Production Research 52:11, pages 3404-3416.
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Salah Haridy, Zhang Wu, Ka Man Lee & M. Abdur Rahim. (2014) An attribute chart for monitoring the process mean and variance. International Journal of Production Research 52:11, pages 3366-3380.
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Yongxin Cao & Velusamy Subramaniam. (2013) Improving the performance of manufacturing systems with continuous sampling plans. IIE Transactions 45:6, pages 575-590.
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Articles from other publishers (2)

P Jeyadurga & S Balamurali. (2017) Evaluation of an np control chart under truncated life test using quick switching sampling system . Transactions of the Institute of Measurement and Control 40:12, pages 3407-3414.
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Zhi Lin Chong, Amitava Mukherjee & Michael B.C. Khoo. (2018) Some distribution-free Lepage-type schemes for simultaneous monitoring of one-sided shifts in location and scale. Computers & Industrial Engineering 115, pages 653-669.
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