Advanced search
Publication Cover
The Journal of Adhesion Volume 51, 1995 - Issue 1-4
Submit an article Journal homepage
16
Views
6
CrossRef citations to date
0
Altmetric
Original Articles

Surface-Force-Induced Nonelastic Deformations Between Micrometer Size Glass Particles and Silicon Substrates

R. C. Bowen Analytical Technology Division, Eastman Kodak Company, Rochester, NY, 14650-2151, U.S.A.
,
L. P. Demejo Image Research and Advanced Development, Eastman Kodak Company, Rochester, NY, 14650-2129, U.S.A.
&
D. S. Rimai Image Research and Advanced Development, Eastman Kodak Company, Rochester, NY, 14650-2129, U.S.A.
Pages 201-210 | Received 07 Mar 1995, Accepted 24 Apr 1995, Published online: 24 Sep 2006

Citations (6)

Keep up to date with the latest research on this topic with citation updates for this article.

Subscribe to citation updates

Read on this site (2)

Gary Toikka, GeoffreyM. Spinks & HughR. Brown. (2000) Interactions Between Micron-sized Glass Particles and Poly(dimethyl siloxane) in the Absence and Presence of Applied Load. The Journal of Adhesion 74:1-4, pages 317-340.
Read now
B. Gady, R. Reifenberger, D.M. Schaefer, R.C. Bowen, D.S. Rimai, L.P. Demejo & W. Vreeland. (1998) Particle Adhesion to Elastomeric Substrates and Elastomeric Substrates with Semi-Rigid Coatings. The Journal of Adhesion 67:1-4, pages 19-36.
Read now

Articles from other publishers (4)

David J. Quesnel, Donald S. Rimai, David M. Schaefer, Stephen P. Beaudoin, Aaron Harrison, Darby Hoss, Melissa Sweat & Myles Thomas. 2016. Developments in Surface Contamination and Cleaning. Developments in Surface Contamination and Cleaning 119 145 .
David J. Quesnel, Donald S. Rimai & David M. Schaefer. 2008. Developments in Surface Contamination and Cleaning. Developments in Surface Contamination and Cleaning 475 501 .
D.S. Rimai & D.J. Quesnel. 2002. Adhesion Science and Engineering. Adhesion Science and Engineering 139 191 .
Hideki T. Miyazaki, Yasushi Tomizawa, Koichi Koyano, Tomomasa Sato & Norio Shinya. (2000) Adhesion force measurement system for micro-objects in a scanning electron microscope. Review of Scientific Instruments 71:8, pages 3123-3131.
Crossref

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Related research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.