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Tatsuhiko Sato, Yosuke Iwamoto, Shintaro Hashimoto, Tatsuhiko Ogawa, Takuya Furuta, Shin-ichiro Abe, Takeshi Kai, Pi-En Tsai, Norihiro Matsuda, Hiroshi Iwase, Nobuhiro Shigyo, Lembit Sihver & Koji Niita. (2018) Features of Particle and Heavy Ion Transport code System (PHITS) version 3.02. Journal of Nuclear Science and Technology 55:6, pages 684-690.
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Articles from other publishers (10)
K. Sugihara, S. Meigo, H. Iwamoto & F. Maekawa. (2024)
Measurement of nuclide production cross sections for GeV-region proton-induced reactions on
Mg,
Si,
Fe,
Cu, and
Zn
. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 549, pages 165299.
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Shin-Ichiro Abe, Masanori Hashimoto, Wang Liao, Takashi Kato, Hiroaki Asai, Kenichi Shimbo, Hideya Matsuyama, Tatsuhiko Sato, Kazutoshi Kobayashi & Yukinobu Watanabe. (2023) A Terrestrial SER Estimation Methodology Based on Simulation Coupled With One-Time Neutron Irradiation Testing. IEEE Transactions on Nuclear Science 70:8, pages 1652-1657.
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Yifan Deng & Yukinobu Watanabe. (2023) A Method of Predicting Muon-Induced SEUs Using Proton Tests and Monte Carlo Simulation. IEEE Transactions on Nuclear Science 70:8, pages 1775-1782.
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Shinichiro Abe. (2023) Soft errors in semiconductor devices due to environmental radiation環境放射線と半導体デバイスのソフトエラー. Journal of the Atomic Energy Society of Japan 65:5, pages 326-330.
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Yuho Hirata, Takeshi Kai, Tatsuhiko Ogawa, Yusuke Matsuya & Tatsuhiko Sato. (2022) Implementation of the electron track-structure mode for silicon into PHITS for investigating the radiation effects in semiconductor devices. Japanese Journal of Applied Physics 61:10, pages 106004.
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Shin-ichiro Abe, Tatsuhiko Sato, Junya Kuroda, Seiya Manabe, Yukinobu Watanabe, Wang Liao, Kojiro Ito, Masanori Hashimoto, Masahide Harada, Kenichi Oikawa & Yasuhiro Miyake. (2020) Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets. Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets.
Masanori Hashimoto, Kazutoshi Kobayashi, Jun Furuta, Shin-Ichiro Abe & Yukinobu Watanabe. (2019) Characterizing SRAM and FF soft error rates with measurement and simulation. Integration 69, pages 161-179.
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Shinichiro Abe, Wang Liao, Seiya Manabe, Tatsuhiko Sato, Masanori Hashimoto & Yukinobu Watanabe. (2019) Impact of Irradiation Side on Neutron-Induced Single-Event Upsets in 65-nm Bulk SRAMs. IEEE Transactions on Nuclear Science 66:7, pages 1374-1380.
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Tatsuhiko Sato, Koji Niita, Yosuke Iwamoto, Shintaro Hashimoto, Tatsuhiko Ogawa, Takuya Furuta, Shin-ichiro Abe, Takeshi Kai, Norihiro Matsuda, Keisuke Okumura, Tetsuya Kai, Hiroshi Iwase & Lembit Sihver. (2017) Recent Improvements of Particle and Heavy Ion Transport code System: PHITS. EPJ Web of Conferences 153, pages 06008.
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Shin-ichiro Abe & Tatsuhiko Sato. (2016) Shielding effect on secondary cosmic-ray neutron- and muon-induced soft errors. Shielding effect on secondary cosmic-ray neutron- and muon-induced soft errors.