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Ashok Shanubhogue & Rajendra G. Desai. (2020) A method of constructing test for the parameter of family of lifetime distributions under Type-II censored sample. Communications in Statistics - Theory and Methods 49:13, pages 3267-3285.
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D. S. Paolino. (2007) Conservative Likelihood Inference for Type I Censored Samples from the Log-Location-Scale Distributions. Communications in Statistics - Simulation and Computation 36:3, pages 519-533.
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Zhenlin Yang, Min Xie & AugustineC.M. Wong. (2007) A unified confidence interval for reliability-related quantities of two-parameter Weibull distribution. Journal of Statistical Computation and Simulation 77:5, pages 365-378.
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R. Calabria & G. Pulcini. (1992) Bayes probability intervals in a load-strength model. Communications in Statistics - Theory and Methods 21:12, pages 3393-3405.
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Helmut Schneider & L. A. Weissfeld. (1989) Interval Estimation Based on Censored Samples from the Weibull Distribution. Journal of Quality Technology 21:3, pages 179-186.
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Articles from other publishers (6)
Natalia Verstina, Evgeny Evseev & Olga Tsuverkalova. Energy efficiency of heat supply as part of the build environment. Energy efficiency of heat supply as part of the build environment.
Daniel Martin, Judith Marks, Tapan K. Saha, Olav Krause & Nadali Mahmoudi. (2018) Investigation Into Modeling Australian Power Transformer Failure and Retirement Statistics. IEEE Transactions on Power Delivery 33:4, pages 2011-2019.
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D. Martin, J. Marks, T. Saha, O. Krause, G. Russell & A. Alibegovic-Memisevic. (2017) On the development of power transformer failure models: An Australian case study. On the development of power transformer failure models: An Australian case study.
Zhenmin Chen. (1997) Statistical inference about the shape parameter of the Weibull distribution. Statistics & Probability Letters 36:1, pages 85-90.
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J.A. Nachlas & A. Kumar. (1993) Reliability estimation using doubly-censored field data. IEEE Transactions on Reliability 42:2, pages 268-279.
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W.-K. Shiue & L.J. Bain. (1989) Robustness and precision of parametric and distribution-free tolerance limits for two lifetime distributions. IEEE Transactions on Reliability 38:2, pages 224-228.
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