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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 25, 1993 - Issue 2
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Articles

Statistical Inference from Start-Up Demonstration Test Data

Roman ViverosMcMaster University, Hamilton, Ontario, CanadaL8S 4K1View further author information
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N. BalakrishnanMcMaster University, Hamilton, Ontario, CanadaL8S 4K1View further author information
Pages 119-130 | Published online: 21 Feb 2018

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Amos E. Gera. (2021) From runs to patterns. Communications in Statistics - Simulation and Computation 50:12, pages 4300-4314.
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Serkan Eryilmaz. (2019) Statistical inference for a class of startup demonstration tests. Journal of Quality Technology 51:3, pages 314-324.
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DavidP. M. Scollnik. (2011) Bayesian Inference for a Class of Start-Up Demonstration Tests with Rejection of Units upon the Observation of d Failures. Communications in Statistics - Theory and Methods 40:14, pages 2528-2538.
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N. Balakrishnan, S. Bersimis & M. V. Koutras. (2009) Run and Frequency Quota Rules in Process Monitoring and Acceptance Sampling. Journal of Quality Technology 41:1, pages 66-81.
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Demetrios L. Antzoulakos, Markos V. Koutras & Athanasios C. Rakitzis. (2009) Start-Up Demonstration Tests Based on Run and Scan Statistics. Journal of Quality Technology 41:1, pages 48-59.
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P. S. Chan, H.K.T. Ng & N. Balakrishnan. (2008) Statistical inference for start-up demonstration tests with rejection of units upon observing d failures. Journal of Applied Statistics 35:8, pages 867-878.
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Michelle L. DePoy Smith & William S. Griffith. (2005) Start-Up Demonstration Tests Based on Consecutive Successes and Total Failures. Journal of Quality Technology 37:3, pages 186-198.
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K. Govindaraju & C. D. Lai. (1999) Design of multiple run sampling plan. Communications in Statistics - Simulation and Computation 28:1, pages 1-11.
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Nikolai Kolev & Leda Minkova. (1997) Discrete distributions related to success runs of lengthk in aulti-state markov chain. Communications in Statistics - Theory and Methods 26:4, pages 1031-1049.
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RomáN Viveros, K. Balasubramanian & N. Balakrishnan. (1994) Binomial and Negative Binomial Analogues under Correlated Bernoulli Trials. The American Statistician 48:3, pages 243-247.
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Elena Castilla. (2024) A new estimation approach based on phi‐divergence measures for one‐shot device accelerated life testing. Quality and Reliability Engineering International.
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Xuchao Bai, Jieqiong Zhang, Mu He & Narayanaswamy Balakrishnan. (2023) Inference for stress–strength reliability of multi-state system with dependent stresses and strengths using improved generalized survival signature. Journal of Computational and Applied Mathematics 420, pages 114809.
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Narayanaswamy Balakrishnan & Man Ho Ling. 2023. Springer Handbook of Engineering Statistics. Springer Handbook of Engineering Statistics 1039 1057 .
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Xuchao Bai, Xiangrong Li, Narayanaswamy Balakrishnan & Mu He. (2022) Reliability analysis for dependent stress-strength reliability of multi-state system using improved generalized survival signature. Computers & Industrial Engineering 165, pages 107941.
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Narayanaswamy Balakrishnan & Elena Castilla. (2021) EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan. Quality and Reliability Engineering International 38:2, pages 780-799.
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Xiaojun Zhu, Kai Liu, Mu He & N. Balakrishnan. (2021) Reliability estimation for one-shot devices under cyclic accelerated life-testing. Reliability Engineering & System Safety 212, pages 107595.
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Narayanaswamy Balakrishnan, Man Ho Ling & Hon Yiu So. 2021. Accelerated Life Testing of One‐shot Devices. Accelerated Life Testing of One‐shot Devices 207 215 .
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N. Balakrishnan, M. V. Koutras & F. S. Milienos. (2016) On the identifiability of start-up demonstration mixture models. Annals of the Institute of Statistical Mathematics 69:4, pages 717-735.
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Yao Cheng & E. A. Elsayed. (2016) Reliability Modeling and Prediction of Systems With Mixture of Units. IEEE Transactions on Reliability 65:2, pages 914-928.
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Narayanaswamy Balakrishnan, Hon Yiu So & Man Ho Ling. (2016) EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution. IEEE Transactions on Reliability 65:2, pages 973-991.
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Man Ho Ling, Hon Yiu So & Narayanaswamy Balakrishnan. (2016) Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing. IEEE Transactions on Reliability 65:1, pages 446-458.
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Narayanaswamy Balakrishnan, Man Ho Ling & Hon Yiu So. 2016. Principles of Performance and Reliability Modeling and Evaluation. Principles of Performance and Reliability Modeling and Evaluation 77 108 .
Michelle L. Depoy Smith & William S. Griffith. (2015) Scan Start-Up Demonstration Test. International Journal of Reliability, Quality and Safety Engineering 22:03, pages 1550014.
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Xian Zhao, Xiaoyue Wang & Ge Sun. (2015) Start-up demonstration tests with sparse connection. European Journal of Operational Research 243:3, pages 865-873.
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Xian Zhao, Ge Sun, Weijuan Xie & Cong Lin. (2014) On generalized multi‐state start‐up demonstration tests. Applied Stochastic Models in Business and Industry 31:3, pages 325-338.
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Amos E. Gera. (2015) Start-up Demonstration Tests Involving a Two-Dimensional TSCSTFCF Procedure. International Journal of Reliability, Quality and Safety Engineering 22:01, pages 1550003.
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Athanasios C. Rakitzis & Demetrios L. Antzoulakos. (2013) Start-up demonstration tests with three-level classification. Statistical Papers 56:1, pages 1-21.
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N. Balakrishnan, M. V. Koutras & F. S. Milienos. (2013) Some binary start-up demonstration tests and associated inferential methods. Annals of the Institute of Statistical Mathematics 66:4, pages 759-787.
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N. Balakrishnan, M.V. Koutras & F.S. Milienos. (2014) Start‐up demonstration tests: models, methods and applications, with some unifications. Applied Stochastic Models in Business and Industry 30:4, pages 373-413.
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N. Balakrishnan & M.H. Ling. (2014) Gamma lifetimes and one-shot device testing analysis. Reliability Engineering & System Safety 126, pages 54-64.
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Athanasios C. Rakitzis & Demetrios L. Antzoulakos. (2013) A Start-Up Demonstration Test Based on Exchangeable Binary Trials. IEEE Transactions on Reliability 62:3, pages 736-745.
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AMOS E. GERA. (2013) A GENERAL MULTI-STATE START-UP DEMONSTRATION TESTING PROCEDURE. International Journal of Reliability, Quality and Safety Engineering 20:04, pages 1350013.
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N. Balakrishnan & M. H. Ling. (2013) Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress. IEEE Transactions on Reliability 62:2, pages 537-551.
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