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William A. Stimson. (2015) Forensic Stability Analysis of Dysfunctional Processes. Forensic Science Policy & Management: An International Journal 6:1-2, pages 37-46.
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P. De Carvalho & Joab De Oliveira Lima. (2008) On the estimation of serial correlation in Markov-dependent production processes. Journal of Applied Statistics 35:7, pages 763-771.
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C. D. Lai, M. Xie & K. Govindaraju. (2000) Study of a Markov model for a high-quality dependent process. Journal of Applied Statistics 27:4, pages 461-473.
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C. D. Lai, K. Govindaraju & M. Xie. (1998) Effects of correlation on fraction non-conforming statistical process control procedures. Journal of Applied Statistics 25:4, pages 535-543.
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M.S. Bebbington &
C.D. Lai. (1998) A generalized negative binomial and applications. Communications in Statistics - Theory and Methods 27:10, pages 2515-2533.
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William H. Woodall. (1997) Control Charts Based on Attribute Data: Bibliography and Review. Journal of Quality Technology 29:2, pages 172-183.
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Articles from other publishers (7)
William A. Stimson. 2018. Forensic Systems Engineering. Forensic Systems Engineering
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William A. Stimson. 2018. Forensic Systems Engineering. Forensic Systems Engineering
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Pei-Wen Chen & Chuen-Sheng Cheng. (2007) Cumulative Count of Conforming Chart with Variable Sampling Intervals for Markov Dependent Production Processes. Cumulative Count of Conforming Chart with Variable Sampling Intervals for Markov Dependent Production Processes.
P. Vellaisamy & S. Sankar. (2005) A Unified Approach for Modeling and Designing Attribute Sampling Plans for Monitoring Dependent Production Processes. Methodology and Computing in Applied Probability 7:3, pages 307-323.
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M. Bebbington, Chin-Diew Lai & K. Govindaraju. (2003) Continuous sampling plans for Markov-dependent production processes under limited inspection capacity. Mathematical and Computer Modelling 38:11-13, pages 1137-1145.
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M Xie, T N Goh & V KuralmaniM. Xie, T. N. Goh & V. Kuralmani. 2002. Statistical Models and Control Charts for High-Quality Processes. Statistical Models and Control Charts for High-Quality Processes
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N. Ye, Q. Zhong & G.E. Rahn. (2000) Confidence assessment of quality prediction from process measurement in sequential manufacturing processes. IEEE Transactions on Electronics Packaging Manufacturing 23:3, pages 177-184.
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