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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 32, 2000 - Issue 3
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Articles

Comparisons of Exponential Life Test Plans with Intermittent Inspections

Sun-Ho KimAgency for Defense Development, Taejon, 305-600KoreaView further author information
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Bong-Jin YumKorea Advanced Institute of Science and Technology, Taejon, 305-701KoreaView further author information
Pages 217-230 | Published online: 20 Feb 2018

Citations (18)

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Read on this site (3)

Lu Lu & Christine M. Anderson-Cook. (2017) Choosing a reliability inspection plan for interval censored data. Quality Engineering 29:3, pages 512-535.
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Wanbo Lu & Tzong-Ru Tsai. (2009) Interval censored sampling plans for the log-logistic lifetime distribution. Journal of Applied Statistics 36:5, pages 521-536.
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Min Kim & Bong-Jin Yum. (2009) Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring. Journal of Applied Statistics 36:1, pages 11-20.
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Articles from other publishers (15)

Seong-Joon Kim, Byeong Min Mun & Suk Joo Bae. (2019) A cost-driven reliability demonstration plan based on accelerated degradation tests. Reliability Engineering & System Safety 183, pages 226-239.
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Chanseok Park. (2018) A quantile variant of the expectation–maximization algorithm and its application to parameter estimation with interval data. Journal of Algorithms & Computational Technology 12:3, pages 253-272.
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Muhammad Aslam, Nasrullah Khan & Chi-Hyuck Jun. (2017) Group SkSP-R sampling plan for accelerated life tests. Sādhanā 42:10, pages 1783-1791.
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Xiaoyang Li, Pengfei Gao & Fuqiang Sun. (2015) Acceptance sampling plan of accelerated life testing for lognormal distribution under time-censoring. Chinese Journal of Aeronautics 28:3, pages 814-821.
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Wei Luo, Chun-hua Zhang, Xun Chen & Yuan-yuan Tan. (2015) Accelerated reliability demonstration under competing failure modes. Reliability Engineering & System Safety 136, pages 75-84.
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Wei Luo, Chunhua Zhang, Xun Chen & Yuanyuan Tan. (2013) Notice of Retraction Accelerated reliability demonstration for Weibull distribution with a nonconstant shape parameter. Notice of Retraction Accelerated reliability demonstration for Weibull distribution with a nonconstant shape parameter.
Wei Luo, Chun-Hua Zhang, Xun Chen & Yuan-Yuan Tan. (2013) Reliability demonstration based on accelerated degradation testing for unknown model parameters. Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability 227:2, pages 162-172.
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Y. L. LIO, TZONG-RU TSAI & SHUO-JYE WU. (2012) THE DESIGNS OF ACCEPTANCE SAMPLING FOR STRENGTH DISTRIBUTIONS WITH PERCENTILES. International Journal of Reliability, Quality and Safety Engineering 19:01, pages 1250004.
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Eric M. Monroe, Rong Pan, Christine M. Anderson-Cook, Douglas C. Montgomery & Connie M. Borror. (2011) A generalized linear model approach to designing accelerated life test experiments. Quality and Reliability Engineering International 27:4, pages 595-607.
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Min Kim & Bong-Jin Yum. (2009) Life test sampling plans for Weibull distributed lifetimes under accelerated hybrid censoring. Statistical Papers 52:2, pages 327-342.
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Tzong-Ru Tsai & Chin-Wei Lin. (2008) Acceptance sampling plans under progressive interval censoring with likelihood ratio. Statistical Papers 51:2, pages 259-271.
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Wanbo Lu & Tzong-Ru Tsai. (2009) Interval censored sampling plans for the gamma lifetime model. European Journal of Operational Research 192:1, pages 116-124.
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TZONG-RU TSAI, HSIN-HAO CHEN & WANBO LU. (2011) THE INSPECTION OF ACCEPTANCE SAMPLING FOR STEP-STRESS TESTS WITH AN EQUALLY-SPACED INTERVAL CENSORING SCHEME. International Journal of Reliability, Quality and Safety Engineering 15:03, pages 203-215.
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Tzong-Ru Tsai, Kuang-Nan Lin, Jyun-You Chiang & Hsaio-Ching Fan. (2008) Progressively Interval-Censored Life Test with Acceptance Sampling. Progressively Interval-Censored Life Test with Acceptance Sampling.
Wanbo Lu & Tzong-Ru Tsai. (2007) Simulated Life Test Plans with Type-I Interval Censoring for the Gamma Lifetime Model. Simulated Life Test Plans with Type-I Interval Censoring for the Gamma Lifetime Model.

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