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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 40, 2008 - Issue 3
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Articles

Assessing a Binary Measurement System

Oana DanilaBusiness and Industrial Statistics Research Group (BISRG), Department of Statistics and Actuarial Sciences, University of Waterloo, WaterlooN2L 3G1, CanadaView further author information
,
Stefan H. SteinerBusiness and Industrial Statistics Research Group (BISRG), Department of Statistics and Actuarial Sciences, University of Waterloo, WaterlooN2L 3G1, CanadaView further author information
&
R. Jock MacKayBusiness and Industrial Statistics Research Group (BISRG), Department of Statistics and Actuarial Sciences, University of Waterloo, WaterlooN2L 3G1, CanadaView further author information
Pages 310-318 | Published online: 21 Nov 2017

Citations (21)

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Sigeng Chen, Stefan H. Steiner, R. Jock Mackay & Asokan Mulayath Variyath. (2022) Assessing a binary measurement system with an underlying continuous measurand using targeted verification. Communications in Statistics: Case Studies, Data Analysis and Applications 8:2, pages 308-330.
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Thomas S. Akkerhuis, Jeroen de Mast & Tashi P. Erdmann. (2019) Estimation of the random error of binary tests using adaptive polynomials. Journal of Quality Technology 51:1, pages 81-93.
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Mark Eschmann, James D. Stamey & Phil D. Young. (2017) Bayesian Assessment of a Binary Measurement System with Baseline Data. American Journal of Mathematical and Management Sciences 36:4, pages 316-327.
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T. Bress. (2017) Heuristics for managing trainable binary inspection systems. Quality Engineering 29:2, pages 262-272.
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Stefan H. Steiner, Yi Lu & R. Jock Mackay. (2016) Assessing binary measurement systems and inspection protocols utilizing follow-up data. Quality Engineering 28:3, pages 329-336.
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Daniel E. Severn, Stefan H. Steiner & R. Jock MacKay. (2016) Assessing Binary Measurement Systems: A Cost-Effective Alternative to Complete Verification. Journal of Quality Technology 48:2, pages 128-138.
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Tashi P. Erdmann, Thomas S. Akkerhuis, Jeroen De Mast & Stefan H. Steiner. (2016) The Statistical Evaluation of a Binary Test Based on Combined Samples. Journal of Quality Technology 48:1, pages 54-67.
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Jeroen de Mast, Thomas Akkerhuis & Tashi Erdmann. (2014) The Statistical Evaluation of Categorical Measurements: “Simple Scales, but Treacherous Complexity Underneath”. Quality Engineering 26:1, pages 16-32.
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NathanielT. Stevens, StefanH. Steiner, RyanP. Browne & R. Jock MacKay. (2013) Gauge R&R studies that incorporate baseline information. IIE Transactions 45:11, pages 1166-1175.
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Oana Danila, StefanH. Steiner & R. Jock MacKay. (2013) Assessing a Binary Measurement System With Varying Misclassification Rates When a Gold Standard Is Available. Technometrics 55:3, pages 335-345.
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Oana Danila, Stefan H. Steiner & R. Jock MacKay. (2012) Assessing a Binary Measurement System with Varying Misclassification Rates Using a Latent Class Random Effects Model. Journal of Quality Technology 44:3, pages 179-191.
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Jeroen De Mast, Tashi P. Erdmann & Wessel N. Van Wieringen. (2011) Measurement System Analysis for Binary Inspection: Continuous Versus Dichotomous Measurands. Journal of Quality Technology 43:2, pages 99-112.
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Daniel P. Beavers, James D. Stamey & B. Nebiyou Bekele. (2011) A Bayesian Model to Assess a Binary Measurement System When No Gold Standard System Is Available. Journal of Quality Technology 43:1, pages 16-27.
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Oana Danila, Stefan H. Steiner & R. Jock MacKay. (2010) Assessment of a Binary Measurement System in Current Use. Journal of Quality Technology 42:2, pages 152-164.
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Ryan P. Browne, R. Jock MacKay & Stefan H. Steiner. (2009) Improved Measurement-System Assessment for Processes with 100% Inspection. Journal of Quality Technology 41:4, pages 376-388.
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Wessel N. van Wieringen & Jeroen de Mast. (2008) Measurement System Analysis for Binary Data. Technometrics 50:4, pages 468-478.
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Stefan Lukow & James C. Weatherall. (2022) Statistical analysis for explosives detection system test and evaluation. Scientific Reports 12:1.
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Stephen Crowder, Collin Delker, Eric Forrest & Nevin MartinStephen Crowder, Collin Delker, Eric Forrest & Nevin Martin. 2020. Introduction to Statistics in Metrology. Introduction to Statistics in Metrology 267 302 .
Thomas Akkerhuis, Jeroen de Mast & Tashi Erdmann. (2017) The statistical evaluation of binary tests without gold standard: Robustness of latent variable approaches. Measurement 95, pages 473-479.
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Tomomichi Suzuki, Yusuke Tsutsumi & Hironobu Kawamura. (2013) Viewpoints to characterize precision evaluation methods in binary measurements. Measurement 46:9, pages 3710-3714.
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Tashi P. Erdmann & Jeroen de Mast. (2012) Assessment of binary inspection with a hybrid measurand. Quality and Reliability Engineering International 28:1, pages 47-57.
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