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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 51, 2019 - Issue 1
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RESEARCH ARTICLE

Strategic allocation of test units in an accelerated degradation test plan

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Read on this site (3)

Chengjie Wang, Jian Liu, Qingyu Yang, Qingpei Hu & Dan Yu. (2023) Recoverability effects on reliability assessment for accelerated degradation testing. IISE Transactions 55:7, pages 698-710.
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Jiaxiang Cai & Zhi-Sheng Ye. (2022) Optimal design of accelerated destructive degradation tests with block effects. IISE Transactions 54:1, pages 73-90.
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Articles from other publishers (8)

Kangzhe He, Qiuzhuang Sun, Min Xie & Way Kuo. (2023) Sequential Bayesian Planning for Accelerated Degradation Tests Considering Sensor Degradation. IEEE Transactions on Reliability 72:3, pages 964-974.
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Bokai Zheng, Cen Chen, Yigang Lin, Xuerong Ye & Guofu Zhai. (2023) Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate. IEEE Transactions on Reliability 72:1, pages 37-48.
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Guanqi Fang, Rong Pan & John Stufken. (2021) Optimal Setting of Test Conditions and Allocation of Test Units for Accelerated Degradation Tests With Two Stress Variables. IEEE Transactions on Reliability 70:3, pages 1096-1111.
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Xiujie Zhao, Piao Chen, Olivier Gaudoin & Laurent Doyen. (2021) Accelerated degradation tests with inspection effects. European Journal of Operational Research 292:3, pages 1099-1114.
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Jiaxiang Cai & Zhisheng YE. (2020) Planning Accelerated Destructive Degradation Test with Block Effects. Planning Accelerated Destructive Degradation Test with Block Effects.
Zhenan Pang, XiaoSheng Si, Changhua Hu, Jianxun Zhang & Hong Pei. (2020) RETRACTED: A Review on Modeling and Analysis of Accelerated Degradation Data for Reliability Assessment. Microelectronics Reliability 107, pages 113602.
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Rong Yuan, Mao Tang, Hui Wang & Haiqing Li. (2019) A Reliability Analysis Method of Accelerated Performance Degradation Based on Bayesian Strategy. IEEE Access 7, pages 169047-169054.
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Chengjie Wang, Qingpei Hu & Dan Yu. 2019. Stochastic Models in Reliability, Network Security and System Safety. Stochastic Models in Reliability, Network Security and System Safety 229 239 .

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