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Original Articles

Inference About Defects in the Presence of Masking

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Pages 247-255 | Published online: 12 Mar 2012

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Read on this site (5)

Tamalika Koley & Anup Dewanji. (2022) Current status data with two competing risks and missing failure types: a parametric approach. Journal of Applied Statistics 49:7, pages 1769-1783.
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Jiaping Wang & Qiqing Yu. (2012) Consistency of the Generalized MLE with Interval-Censored and Masked Competing Risks Data. Communications in Statistics - Theory and Methods 41:23, pages 4360-4377.
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Jiaping Wang, Qiqing Yu & GeorgeY. C. Wong. (2012) The random partition masking model for interval-censored and masked competing risks data. Journal of Statistical Computation and Simulation 82:7, pages 981-1002.
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Ansa Alphonsa Antony & P.G. Sankaran. (2008) Nonparametric estimation of bivariate survivor function under masked causes of failure. Journal of Nonparametric Statistics 20:1, pages 77-89.
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Chiranjit Mukhopadhyay & Sanjib Basu. (2007) Bayesian Analysis of Masked Series System Lifetime Data. Communications in Statistics - Theory and Methods 36:2, pages 329-348.
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Articles from other publishers (8)

Jiahui Li & Qiqing Yu. (2014) A consistent NPMLE of the joint distribution function with competing risks data under the dependent masking and right-censoring model. Lifetime Data Analysis 22:1, pages 63-99.
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Sanjib Basu. 2014. Wiley StatsRef: Statistics Reference Online. Wiley StatsRef: Statistics Reference Online.
Lynn Kuo. 2014. Wiley StatsRef: Statistics Reference Online. Wiley StatsRef: Statistics Reference Online.
Sanjib Basu. 2007. Encyclopedia of Statistics in Quality and Reliability. Encyclopedia of Statistics in Quality and Reliability.
Lynn Kuo. 2007. Encyclopedia of Statistics in Quality and Reliability. Encyclopedia of Statistics in Quality and Reliability.
Zhibin Tan. (2005) An equivalence based approach to dealing with uncertainty in maximum likelihood estimation. An equivalence based approach to dealing with uncertainty in maximum likelihood estimation.
Ananda Sen, Sanjib Basu & Mousumi Banerjee. 2001. Advances in Reliability. Advances in Reliability 523 540 .
Betty J. Flehinger, Benjamin Reiser & Emmanuel Yashchin. 2001. Advances in Reliability. Advances in Reliability 499 522 .

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