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Technometrics Volume 55, 2013 - Issue 2
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Original Articles

Field-Failure Predictions Based on Failure-Time Data With Dynamic Covariate Information

Yili Hong Department of Statistics, Virginia Tech, Blacksburg, VA, 24061
&
William Q. Meeker Department of Statistics, Iowa State University, Ames, IA, 50011
Pages 135-149 | Received 01 Jul 2011, Published online: 22 May 2013

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Qinglong Tian, Fanqi Meng, Daniel J. Nordman & William Q. Meeker. (2022) Predicting the Number of Future Events. Journal of the American Statistical Association 117:539, pages 1296-1310.
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Colin Lewis-Beck, Qinglong Tian & William Q. Meeker. (2022) Prediction of Future Failures for Heterogeneous Reliability Field Data. Technometrics 64:1, pages 125-138.
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Ran Jin, Xinwei Deng, Xiaoyu Chen, Liang Zhu & Jun Zhang. (2019) Dynamic quality-process model in consideration of equipment degradation. Journal of Quality Technology 51:3, pages 217-229.
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Wujun Si, Qingyu Yang & Xin Wu. (2019) Material Degradation Modeling and Failure Prediction Using Microstructure Images. Technometrics 61:2, pages 246-258.
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Man Zhang, Yili Hong & Narayanaswamy Balakrishnan. (2018) The generalized Poisson-binomial distribution and the computation of its distribution function. Journal of Statistical Computation and Simulation 88:8, pages 1515-1527.
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Yili Hong, Man Zhang & William Q. Meeker. (2018) Big data and reliability applications: The complexity dimension. Journal of Quality Technology 50:2, pages 135-149.
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Wujun Si, Qingyu Yang, Xin Wu & Yong Chen. (2018) Reliability analysis considering dynamic material local deformation. Journal of Quality Technology 50:2, pages 183-197.
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Shuguang He, Zhaomin Zhang, Wei Jiang & Dejun Bian. (2018) Predicting field reliability based on two-dimensional warranty data with learning effects. Journal of Quality Technology 50:2, pages 198-206.
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Wei Zhang, Ye Tian, Luis A. Escobar & William Q. Meeker. (2017) Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes. Technometrics 59:2, pages 202-214.
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Zhibing Xu, Yili Hong, William Q. Meeker, Brock E. Osborn & Kati Illouz. (2017) A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data. Technometrics 59:2, pages 225-236.
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Xiao Liu & Loon Ching Tang. (2016) Reliability analysis and spares provisioning for repairable systems with dependent failure processes and a time-varying installed base. IIE Transactions 48:1, pages 43-56.
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WilliamQ. Meeker & Yili Hong. (2014) Rejoinder. Quality Engineering 26:1, pages 127-129.
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WilliamQ. Meeker & Yili Hong. (2014) Reliability Meets Big Data: Opportunities and Challenges. Quality Engineering 26:1, pages 102-116.
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William Q. Meeker, Georgios Sarakakis & Athanasios Gerokostopoulos. (2013) Rejoinder. Journal of Quality Technology 45:3, pages 240-243.
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