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Technometrics Volume 56, 2014 - Issue 4
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Original Articles

Semiparametric Estimation of Gamma Processes for Deteriorating Products

Zhi-Sheng YeDepartment of Industrial & Systems EngineeringNational University of SingaporeSingapore119260Singapore
,
Min XieDepartment of Industrial & Systems EngineeringNational University of SingaporeSingapore119260Singapore;Department of Systems Engineering and Engineering Management City University of Hong KongKowloon, Hong Kong ([email protected])
,
Loon-Ching TangDepartment of Industrial & Systems EngineeringNational University of SingaporeSingapore119260Singapore
&
Nan ChenDepartment of Industrial & Systems EngineeringNational University of SingaporeSingapore119260Singapore
Pages 504-513 | Received 01 Dec 2012, Published online: 10 Dec 2014

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Huibing Hao, Chun Su & Chunping Li. (2017) Real-time reliability evaluation based on independent increment process with random effect. Quality Technology & Quantitative Management 14:3, pages 325-340.
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Zhi-Sheng Ye & Nan Chen. (2017) Closed-Form Estimators for the Gamma Distribution Derived From Likelihood Equations. The American Statistician 71:2, pages 177-181.
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Yin Shu, Qianmei Feng, Edward P.C. Kao & Hao Liu. (2016) Lévy-driven non-Gaussian Ornstein–Uhlenbeck processes for degradation-based reliability analysis. IIE Transactions 48:11, pages 993-1003.
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