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Journal of Statistical Computation and Simulation Volume 84, 2014 - Issue 4
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Original Articles

Planning step-stress test under Type-I censoring for the exponential case

Chien-Tai LinDepartment of Mathematics, Tamkang University, New Taipei CityTaiwanCorrespondence[email protected]
,
Cheng-Chieh ChouDepartment of Mathematics, Tamkang University, New Taipei CityTaiwan
&
N. BalakrishnanDepartment of Mathematics and Statistics, McMaster University, HamiltonOntario, Canada, L8S 4K1
Pages 819-832 | Received 22 Mar 2012, Accepted 09 Sep 2012, Published online: 22 Oct 2012

Citations (7)

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Read on this site (2)

Lee-Shen Chen, TaChen Liang & Ming-Chung Yang. (2022) Designing Bayesian sampling plans for simple step-stress of accelerated life test on censored data. Journal of Statistical Computation and Simulation 92:2, pages 395-415.
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Lijuan Shen, Dayu Sun, Zhisheng Ye & Xingqiu Zhao. (2017) Inference on an Adaptive Accelerated Life Test with Application to Smart-Grid Data-Acquisition-Devices. Journal of Quality Technology 49:3, pages 191-212.
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Articles from other publishers (5)

P. Yadav, D. Kumar & S. Singh. (2023) Statistical Analysis for Log-Normal Distribution in the Presence of Hybrid Censoring and Step-Stress. Strength of Materials 55:3, pages 552-565.
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De-qiang Zheng & Xiang-zhong Fang. (2021) Exact Confidence Limits for the Parameter of an Exponential Distribution in the Accelerated Life Tests under Type-I Censoring. Acta Mathematicae Applicatae Sinica, English Series 37:2, pages 393-408.
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Chien-Tai Lin, Cheng-Chieh Chou & N. Balakrishnan. (2019) Planning step-stress test plans under Type-I hybrid censoring for the log-location-scale distribution. Statistical Methods & Applications 29:2, pages 265-288.
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Deqiang Zheng & Xiangzhong Fang. (2017) Exact Confidence Limits for the Acceleration Factor Under Constant-Stress Partially Accelerated Life Tests With Type-I Censoring. IEEE Transactions on Reliability, pages 1-13.
Crossref
Firoozeh Haghighi. (2015) Simple step-stress model for an extension of the exponential distribution with type-I censoring. International Journal of Quality & Reliability Management 32:8, pages 906-920.
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