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Journal of Statistical Computation and Simulation Volume 85, 2015 - Issue 9
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Original Articles

A rational sequential probability ratio test control chart for monitoring process shifts in mean and variance

Yanjing OuSchool of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore639798, SingaporeCorrespondence[email protected]
,
Zhang WuSchool of Mathematical Sciences, Universiti Sains Malaysia, 11800Georgetown, Penang, Malaysia
,
Michael B. C. KhooSchool of Mathematical Sciences, Universiti Sains Malaysia, 11800Georgetown, Penang, Malaysia
&
Nan ChenDepartment of Industrial and Systems Engineering, National University of Singapore, Singapore117576, Singapore
Pages 1765-1781 | Received 26 Oct 2013, Accepted 02 Mar 2014, Published online: 01 Apr 2014

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Read on this site (4)

Shashibhushan B. Mahadik & Dadasaheb G. Godase. (2023) The SPRT sign chart for process location. Communications in Statistics - Theory and Methods 52:7, pages 2276-2290.
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Shashibhushan B. Mahadik, Dadasaheb G. Godase & W. L. Teoh. (2021) A two-sided SPRT control chart for process dispersion. Journal of Statistical Computation and Simulation 91:17, pages 3603-3614.
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Nurudeen A. Adegoke, Adam N. H. Smith, Marti J. Anderson & Matthew D. M. Pawley. (2021) MEWMA charts when parameters are estimated with applications in gene expression and bimetal thermostat monitoring. Journal of Statistical Computation and Simulation 91:1, pages 37-57.
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Muhammad Aslam, Nasrullah Khan & Chi-Hyuck Jun. (2016) A control chart for time truncated life tests using Pareto distribution of second kind. Journal of Statistical Computation and Simulation 86:11, pages 2113-2122.
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Articles from other publishers (12)

Dong Ding, Jian Li, Fugee Tsung & Yang Li. (2023) A Phase II score‐based distribution‐free method for jointly monitoring location and scale. Quality and Reliability Engineering International 39:7, pages 3030-3040.
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Emmanuel Afuecheta, Mujahida Sayyed, Idika E. Okorie & Saralees Nadarajah. (2023) A compound exponential distribution with application to control charts. Journal of Computational and Applied Mathematics 417, pages 114598.
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Dadasaheb G. Godase & Shashibhushan B. Mahadik. (2022) The SPRT Sign Chart for Process Dispersion. Stochastics and Quality Control 37:1, pages 101-106.
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Dadasaheb G. Godase, Shashibhushan B. Mahadik & Athanasios C. Rakitzis. (2021) The SPRT control charts for the Maxwell distribution. Quality and Reliability Engineering International 38:4, pages 1713-1728.
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Muhammad Riaz, Qurat‐Ul‐Ain Khaliq, Muhammad Abid & Irshad Ahmad Arshad. (2021) On designing efficient sequential schemes to monitor non‐normal processes. Quality and Reliability Engineering International 38:1, pages 615-634.
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Muhammad Aslam, Aamir Saghir & Liaquat Ahmad. 2020. Introduction to Statistical Process Control. Introduction to Statistical Process Control 121 159 .
Srinivasa Rao Gadde, A. K. Fulment & P. K. Josephat. (2019) Attribute control charts for the Dagum distribution under truncated life tests. Life Cycle Reliability and Safety Engineering 8:4, pages 329-335.
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Dadasaheb G. Godase & Shashibhushan B. Mahadik. (2019) The SPRT control chart for process dispersion. Quality and Reliability Engineering International 35:6, pages 1878-1889.
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Jean-Claude Malela-Majika. (2019) Modified side-sensitive synthetic double sampling monitoring scheme for simultaneously monitoring the process mean and variability. Computers & Industrial Engineering 130, pages 798-814.
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Gabor Gardonyi, Gabor Por & Krisztian Samu. (2019) An Enhanced Evaluation Method of Sequential Probability Ratio Test. Mathematical Problems in Engineering 2019, pages 1-12.
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Zhi Lin Chong, Amitava Mukherjee & Michael B.C. Khoo. (2018) Some distribution-free Lepage-type schemes for simultaneous monitoring of one-sided shifts in location and scale. Computers & Industrial Engineering 115, pages 653-669.
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Chenglong Li, Amitava Mukherjee, Qin Su & Min Xie. (2016) Design and Implementation of Two CUSUM Schemes for Simultaneously Monitoring the Process Mean and Variance with Unknown Parameters. Quality and Reliability Engineering International 32:8, pages 2961-2975.
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