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Original Articles

On the origin of disclocations observed by X-ray topography during microdeformation tests on f.c.c. metals

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Pages 341-353 | Received 20 Jul 1978, Accepted 03 Oct 1978, Published online: 13 Sep 2006

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Read on this site (8)

B. Pichaud, P. Jean & F. Minari. (1986) Dislocation motion by double-kink migration in a bent crystal Velocity measurements in silicon. Philosophical Magazine A 54:4, pages 479-487.
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F. Minari, B. Pichaud & M. Burle. (1982) Production of a large planar array of Lomer-Cottrell locks in silver by controlled mechanical straining. Philosophical Magazine A 46:3, pages 531-534.
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M. Burle, B. Pichaud & F. Minari. (1982) Structure of dislocation bands produced by a bending stress in a low-stacking-fault energy f.c.c. material: Ag-1·2 at. % Sn. Philosophical Magazine A 45:6, pages 1037-1045.
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B. Pichaud, M. Burle & F. Minari. (1981) Selection of the glide systems activated at low stresses in copper. Philosophical Magazine A 44:3, pages 689-698.
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I.M. Buckley-golder & B.K. Tanner. (1980) Deformation studies of initially dislocation-free copper crystals 111. In situ X-ray topography. Philosophical Magazine A 42:4, pages 559-573.
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F. Minari, B. Pichaud & L. Capella. (1980) X-ray topographic analysis of a particular dislocation-dislocation interaction inducing cross-slip. Philosophical Magazine A 41:2, pages 281-289.
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B. Pichaud & F. Minari. (1979) Further topographic observations of zigzag stress-induced dislocations in copper crystals. Philosophical Magazine A 40:1, pages 121-124.
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Articles from other publishers (4)

N. Durbec, B. Pichaud & F. Minari. (1981) Glide systems in gallium: justification by dislocation specific energies. Journal of the Less Common Metals 82, pages 373-377.
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F. Minari & B. Pichaud. 1981. Dislocation Modelling of Physical Systems. Dislocation Modelling of Physical Systems 559 563 .
B. Pichaud & F. Minari. (1980) <110> {110} Slip in copper slightly deformed at room temperature. Scripta Metallurgica 14:11, pages 1171-1174.
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B. K. Tanner. 1980. Characterization of Crystal Growth Defects by X-Ray Methods. Characterization of Crystal Growth Defects by X-Ray Methods 456 473 .

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