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Philosophical Magazine A Volume 41, 1980 - Issue 6
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Original Articles

Study of single-electron excitations by electron microscopy II. Cathodoluminescence image contrast from localized energy transfers

S. J. Pennycook Cavendish Laboratory, Madingley Road, Cambridge, CB3 0HE, England
&
A. Howie Cavendish Laboratory, Madingley Road, Cambridge, CB3 0HE, England
Pages 809-827 | Received 01 Oct 1979, Accepted 10 Nov 1979, Published online: 04 Oct 2006

Citations (43)

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Read on this site (2)

A. Howie, F.J. Rocca & U. Valdrè. (1985) Electron beam ionization damage processes in p-terphenyl. Philosophical Magazine B 52:3, pages 751-757.
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A.J. Bourdillon, P.G. Self & W.M. Stobbs. (1981) Crystallographic orientation effects in energy dispersive X-ray analysis. Philosophical Magazine A 44:6, pages 1335-1350.
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Articles from other publishers (41)

Dayne F. Swearer, Stefan Fischer, Daniel K. Angell, Chris Siefe, A. Paul Alivisatos, Steven Chu & Jennifer A. Dionne. (2021) Single Particle Cathodoluminescence Spectroscopy with Sub-20 nm, Electron-Stable Phosphors. ACS Photonics 8:6, pages 1539-1547.
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Julia I. Deitz, A. T. M. Golam Sarwar, Santino D. Carnevale, Tyler J. Grassman, Roberto C. Myers & David W. McComb. (2018) Nano-Cathodoluminescence Measurement of Asymmetric Carrier Trapping and Radiative Recombination in GaN and InGaN Quantum Disks. Microscopy and Microanalysis 24:2, pages 93-98.
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Stephen J. Pennycook. (2017) The impact of STEM aberration correction on materials science. Ultramicroscopy 180, pages 22-33.
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M. Kociak & L.F. Zagonel. (2017) Cathodoluminescence in the scanning transmission electron microscope. Ultramicroscopy 176, pages 112-131.
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. (2017) Publisher's Note. Ultramicroscopy 174, pages 50.
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Jane Howe, Yoichiro Hashimoto, Xue Wang, Madeline Vara, David Hoyle, Tom Schamp, Younan Xia & David Joy. (2015) Detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging. Microscopy and Microanalysis 21:S3, pages 1265-1266.
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Mathieu Kociak, Odile Stéphan, Alexandre Gloter, Luiz F. Zagonel, Luiz H.G. Tizei, Marcel Tencé, Katia March, Jean Denis Blazit, Zackaria Mahfoud, Arthur Losquin, Sophie Meuret & Christian Colliex. (2014) Seeing and measuring in colours: Electron microscopy and spectroscopies applied to nano-optics. Comptes Rendus Physique 15:2-3, pages 158-175.
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L F Zagonel, L Rigutti, M Tchernycheva, G Jacopin, R Songmuang & M Kociak. (2012) Visualizing highly localized luminescence in GaN/AlN heterostructures in nanowires. Nanotechnology 23:45, pages 455205.
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R.F. Egerton. (2012) Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV. Microscopy Research and Technique 75:11, pages 1550-1556.
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Stephen J. Pennycook. 2002. Characterization of Materials. Characterization of Materials 1 29 .
Stephen J. Pennycook. (2012) Scanning transmission electron microscopy: Seeing the atoms more clearly. MRS Bulletin 37:10, pages 943-951.
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Mathieu Kociak & Javier García de Abajo. (2012) Nanoscale mapping of plasmons, photons, and excitons. MRS Bulletin 37:1, pages 39-46.
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A. Howie. (2011) New Strategies for e-Beam Characterization of Catalysts. ChemCatChem 3:6, pages 961-964.
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H. Inada, D. Su, R.F. Egerton, M. Konno, L. Wu, J. Ciston, J. Wall & Y. Zhu. (2011) Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms. Ultramicroscopy 111:7, pages 865-876.
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Stephen J. Pennycook. 2011. Scanning Transmission Electron Microscopy. Scanning Transmission Electron Microscopy 1 90 .
David C. Joy. (2009) Second best no more. Nature Materials 8:10, pages 776-777.
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S.J. Pennycook. 2002. Characterization of Materials. Characterization of Materials.
S.J. Pennycook. (2020) Diffraction Channeling and the Production of Secondary Excitation. Microscopy and Microanalysis 5:S2, pages 688-689.
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C. H. Seager, N. A. Missert, D. R. Tallant & W. L. Warren. (1998) Scanning cathodoluminescence as a probe of surface recombination in phosphors excited at low electron energies. Journal of Applied Physics 83:2, pages 1153-1155.
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Stefan Myhajlenko. 1998. Luminescence of Solids. Luminescence of Solids 135 188 .
Ludwig ReimerLudwig Reimer. 1997. Transmission Electron Microscopy. Transmission Electron Microscopy 79 142 .
Ludwig ReimerLudwig Reimer. 1993. Transmission Electron Microscopy. Transmission Electron Microscopy 375 430 .
David C. Joy & James B. Pawley. (1992) High-resolution scanning electron microscopy. Ultramicroscopy 47:1-3, pages 80-100.
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S.J. Pennycook & D.E. Jesson. (1992) Atomic resolution Z-contrast imaging of interfaces. Acta Metallurgica et Materialia 40, pages S149-S159.
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David C. Joy. (1991) The theory and practice of high-resolution scanning electron microscopy. Ultramicroscopy 37:1-4, pages 216-233.
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S.J. Pennycook & D.E. Jesson. (1991) High-resolution Z-contrast imaging of crystals. Ultramicroscopy 37:1-4, pages 14-38.
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Z.L. Wang & A. Howie. (1990) Electron beam radiation damages of α-alumina (0,1̄,1) surfaces with different atomic terminations. Surface Science 226:3, pages 293-306.
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A.L. Bleloch, A. Howie & R.H. Milne. (1989) High resolution secondary electron imaging and spectroscopy. Ultramicroscopy 31:1, pages 99-110.
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R.H. Milne. (1989) Surface steps imaged by secondary electrons. Ultramicroscopy 27:4, pages 433-437.
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Frank Glas. (1989) Quantitative study of spurious X-ray production in thin film microanalysis. Journal of Microscopy 154:1, pages 19-29.
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Ludwig ReimerLudwig Reimer. 1989. Transmission Electron Microscopy. Transmission Electron Microscopy 375 430 .
P.E. BATSON. 1988. 337 387 .
S.J. Pennycook. (1988) Delocalization corrections for electron channeling analysis. Ultramicroscopy 26:1-2, pages 239-248.
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Kannan M. Krishnan. (1988) Atomic site and species determinations using channeling and related effects in analytical electron microscopy. Ultramicroscopy 24:2-3, pages 125-141.
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A. Howie. 1989. Surface and Interface Characterization by Electron Optical Methods. Surface and Interface Characterization by Electron Optical Methods 11 18 .
B. G. Yacobi & D. B. Holt. (1986) Cathodoluminescence scanning electron microscopy of semiconductors. Journal of Applied Physics 59:4, pages R1-R24.
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Ludwig ReimerLudwig Reimer. 1984. Transmission Electron Microscopy. Transmission Electron Microscopy 365 420 .
A. Howie. (2020) Localisation and Momentum Transfer in Inelastic Scattering. Proceedings, annual meeting, Electron Microscopy Society of America 39, pages 186-189.
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J.C.H. Spence. (2020) High Resolution Electron Microscopy of Semiconductor Defects. Proceedings, annual meeting, Electron Microscopy Society of America 39, pages 120-123.
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S.J. Pennycook. (1981) Investigation of the electronic effects of dislocations by stem. Ultramicroscopy 7:1, pages 99-104.
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J.C.H. Spence. (1981) The crystallographic information in localised characteristic loss electron images and diffraction patterns. Ultramicroscopy 7:1, pages 59-64.
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