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Philosophical Magazine A Volume 53, 1986 - Issue 5
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Original Articles

Forbidden-reflection lattice imaging for the determination of kink densities on partial dislocations

H. Alexander Department of Physics, Arizona State University, Tempe, Arizona, 85287, U.S.A.; Physics Institute, Universität zu Köln, D5 Köln 41, F.R. Germany
,
J. c. H. Spence Department of Physics, Arizona State University, Tempe, Arizona, 85287, U.S.A.
,
D. Shindo Department of Physics, Arizona State University, Tempe, Arizona, 85287, U.S.A.
,
H. Gottschalk Department of Physics, Arizona State University, Tempe, Arizona, 85287, U.S.A.; Physics Institute, Universität zu Köln, D5 Köln 41, F.R. Germany
&
N. Long Department of Physics, Arizona State University, Tempe, Arizona, 85287, U.S.A.
Pages 627-643 | Received 15 May 1985, Published online: 27 Sep 2006

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S. Youssef & R. Bonnet. (2007) The elastic potential energy of a thin foil deformed by an in-plane 60° dislocation. Philosophical Magazine 87:31, pages 4935-4948.
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J. C. H. Spence , H. R. Kolar, G. Hembree, C. J. Humphreys, J. Barnard, R. Datta, C. Koch, F. M. Ross & J. F. Justo. (2006) Imaging dislocation cores – the way forward. Philosophical Magazine 86:29-31, pages 4781-4796.
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K. Suzuki, N. Maeda & S. Takeuchi. (1996) High resolution electron microscopy of dissociated dislocations in silicon with a normal-incident electron beam. Philosophical Magazine A 73:2, pages 431-441.
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D. Shindo, M.H. Yoo, S. Hanada & K. Hiraga. (1991) Direct observation of the shear APB interface in Fe3Al by HREM. Philosophical Magazine A 64:6, pages 1281-1290.
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John Spence. (2002) Achieving atomic resolution. Materials Today 5:3, pages 20-33.
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P.E Batson. (1999) Atomic resolution EELS analysis of a misfit dislocation at a GeSi/Si interface. Physica B: Condensed Matter 273-274, pages 593-597.
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P. E. Batson. (1999) Atomic and Electronic Structure of a Dissociated 60° Misfit Dislocation in . Physical Review Letters 83:21, pages 4409-4412.
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J.C.H. Spence. (1999) Atomistics and mechanical properties of silicon. Acta Materialia 47:15-16, pages 4153-4159.
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J.C.H. Spence. (1999) The future of atomic resolution electron microscopy for materials science. Materials Science and Engineering: R: Reports 26:1-2, pages 1-49.
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H. Alexander, H. R. Kolar & J. C. H. Spence. (1999) Kinks on Partials of 60° Dislocations in Silicon as Revealed by a Novel TEM Technique. physica status solidi (a) 171:1, pages 5-16.
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