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Dislocation transmission through ∑ = 9 symmetrical tilt boundaries in silicon and germanium

II. Dynamic and crystallographic analysis

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Pages 165-181 | Received 14 Jul 1986, Accepted 08 Aug 1986, Published online: 20 Aug 2006

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A. Taisne, B. Decamps & L. Priester. (2002) Interaction of lattice dislocations with the α-γ interphase interface in a stainless steel bicrystal. Philosophical Magazine A 82:15, pages 2791-2804.
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M. Polcarova, J. Gemperlova, J. Bradler, A. Jacques, A. George & L. Priester. (1998) In-situ observation of plastic deformation of Fe-Si bicrystals by white-beam synchrotron radiation topography. Philosophical Magazine A 78:1, pages 105-130.
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S. Poulat, B. Décamps & L. Priester. (1998) Weak-beam transmission electron microscopy study of dislocation accommodation processes in nickel Σ = 3 grain boundaries. Philosophical Magazine A 77:6, pages 1381-1397.
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M. Elkajbaji & J. Thibault-Desseaux. (1988) Interactions of deformation-induced dislocations with Σ = 9(122) grain boundaries in Si studied by HREM. Philosophical Magazine A 58:2, pages 325-345.
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M. Martinez-Hernandez, H.O. K. Kirchner, A. Korner, A. George & J.P. Michel. (1987) Dislocations at grain boundaries in deformed silicon. Philosophical Magazine A 56:5, pages 641-658.
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X. Baillin, J. Pelissier, J.J. Bacmann, A. Jacques & A. George. (1987) Dislocation transmission through ∑ = 9 symmetrical tilt boundaries in silicon and germanium. Philosophical Magazine A 55:2, pages 143-164.
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J. P. Couzinié, B. Décamps & L. Priester. (2004) On the first steps of grain boundary dislocation stress relaxations in copper. Zeitschrift für Metallkunde 95:4, pages 223-225.
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A. Jacques, A. George, M. Polcarova & J. Bradler. (2003) Dislocation transmission through a Σ=3 grain boundary in Fe 6 at.% Si: In situ experiments in compression specimen. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 200, pages 261-266.
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Jany Thibault, Jean-Luc Rouviere & Alain Bourret. 2000. Handbook of Semiconductor Technology Set. Handbook of Semiconductor Technology Set 377 451 .
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Jany. Thibault, X. Baillin, J. Pelissier, J.L. Putaux & H.M. Michaud. (2011) In-Situ 1Mev Tem and Hrem Study of the Deformation and the Transformation of Symmetrical Tilt Grain Boundaries in Ge and Si.. MRS Proceedings 319.
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Ian Baker & Fuping Liu. (2011) On In-Situ Study of Dislocation/Grain Boundary Interactions Using X-ray Topography and Tem . MRS Proceedings 319.
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H. A. Benhorma, A. Jacques, A. George & X. Baillin. (1992) Velocity of grain-boundary dislocations in a Σ = 9 bicrystal of silicon. Physica Status Solidi (a) 131:2, pages 539-554.
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S. L. Hyland, C. Dubé & D. G. Ast. (1990) Investigation of the reversibility of deformation in silicon sheets. Journal of Electronic Materials 19:9, pages 873-879.
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A. Jacques, A. George & X. Baillin. 1989. Strength of Metals and Alloys (ICSMA 8). Strength of Metals and Alloys (ICSMA 8) 245 250 .
X. Baillin, A. Jacques & A. George. 1989. Polycrystalline Semiconductors. Polycrystalline Semiconductors 34 39 .
J. Thibault-Desseaux. 1989. Semiconductor Silicon. Semiconductor Silicon 160 173 .
J. Thibault-Desseaux, J. L. Putaux & H. O. K. Kirchner. 1989. Point and Extended Defects in Semiconductors. Point and Extended Defects in Semiconductors 153 164 .
W. Skrotzki, H. Wendt, C.B. Carter & D.L. Kohlstedt. (1988) The relation between the structure and mechanical properties of A σ = 51 tilt boundary in germanium. Acta Metallurgica 36:4, pages 983-994.
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Jany Thibault-Desseaux, J.L. Putaux, A. Jacques & M. Elkajbaji. (2011) Mechanical Behaviour of the Σ=9(122) Grain Boundary in Silicon Studied by Hrem. MRS Proceedings 122.
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A. George. (1988) Hardening mechanisms at grain boundaries: a microscopic approach. Revue de Physique Appliquée 23:4, pages 479-490.
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