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Philosophical Magazine A Volume 59, 1989 - Issue 6
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Original Articles

Structure of twin boundaries with added tilt and twist in silicon

A. Garg Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio, 43210, U.S.A.
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W. A. T. Clark Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio, 43210, U.S.A.
&
J. P. Hirth Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio, 43210, U.S.A.
Pages 1205-1220 | Received 21 Jun 1988, Accepted 18 Jul 1988, Published online: 20 Aug 2006

Citations (6)

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Read on this site (1)

Ph. Komninou & G.P. Dimitrakopulos. (1998) Interfacial dislocations at the junction lines of {211} microfacets of a twin boundary in silicon. Philosophical Magazine A 78:2, pages 255-272.
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Articles from other publishers (5)

H.Y. Wang, N. Usami, K. Fujiwara, K. Kutsukake & K. Nakajima. (2009) Microstructures of Si multicrystals and their impact on minority carrier diffusion length. Acta Materialia 57:11, pages 3268-3276.
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S. C. Hogg & H. V. Atkinson. (2005) Inhibited coarsening of a spray-formed and extruded hypereutectic aluminum-silicon alloy in the semisolid state. Metallurgical and Materials Transactions A 36:1, pages 149-159.
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Pietro P. Altermatt & Gernot Heiser. (2002) Predicted electronic properties of polycrystalline silicon from three-dimensional device modeling combined with defect-pool model. Journal of Applied Physics 92:5, pages 2561-2574.
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J.P Hirth. (2000) Some current topics in dislocation theory. Acta Materialia 48:1, pages 93-104.
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William A. T. Clark. (2020) The role of Electron Microscopy in the study of grain boundaries. Proceedings, annual meeting, Electron Microscopy Society of America 48:4, pages 330-331.
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