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Philosophical Magazine A Volume 66, 1992 - Issue 6
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Original Articles

Atomic structures at cobalt silicide-silicon interfaces

A. Catana IBM Research Division, Zürich Research Laboratory, 8803, Rüschlikon, Switzerland
,
P. E. Schmid Institute of Applied Physics, Swiss Federal Institute of Technology, 1015, Lausanne, Switzerland
,
P. Lu Department of Mechanics and Materials Science, Rutgers University, Piscataway, New Jersey, 08855, USA
&
D. J. Smith Center for Solid State Science and Department of Physics, Arizona State University, Tempe, Arizona, 85287, USA
Pages 933-956 | Received 19 Sep 1991, Accepted 09 Mar 1992, Published online: 14 Dec 2006

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X. Portier, R. Rizk, G. Nouet & G. Allais. (1995) High-resolution electron microscopy observations of silicon/nickel silicide interfaces in a ∑ = 25 silicon bicrystal. Philosophical Magazine A 71:5, pages 1109-1123.
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Articles from other publishers (14)

Liwei D. Geng, Ranjit Pati & Yongmei M. Jin. (2020) Electric field control of magnetism at the γ-FeSi2/Si(001) interface. Journal of Materials Science 56:5, pages 3804-3813.
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J C Mahato, Debolina Das, Nasrin Banu, Biswarup Satpati & B N Dev. (2017) Unidirectional endotaxial cobalt di-silicide nanowires on Si(110) substrates. Nanotechnology 28:42, pages 425603.
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A. A. Alekseev, D. A. Olyanich, T. V. Utas, V. G. Kotlyar, A. V. Zotov & A. A. Saranin. (2015) Scanning tunneling microscopy observation of ultrathin epitaxial CoSi2(111) films grown at a high temperature. Technical Physics 60:10, pages 1508-1514.
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Gerhard Sauthoff. 2006. Materials Science and Technology. Materials Science and Technology.
David J. Smith. 2005. Handbook of Microscopy for Nanotechnology. Handbook of Microscopy for Nanotechnology 427 453 .
C. Ghica, L. Nistor, H. Bender, A. Steegen, A. Lauwers, K. Maex & J. Van Landuyt. (2012) In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates . Journal of Materials Research 16:3, pages 701-708.
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J.C.H. Spence. (1999) The future of atomic resolution electron microscopy for materials science. Materials Science and Engineering: R: Reports 26:1-2, pages 1-49.
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David J Smith. (1997) The realization of atomic resolution with the electron microscope. Reports on Progress in Physics 60:12, pages 1513-1580.
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X. Portier, A. Ihlal & R. Rizk. (1997) Iron Silicide Formation by Precipitation in a Silicon Bicrystal. physica status solidi (a) 161:1, pages 75-84.
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Gerhard Sauthoff. 1995. Intermetallics. Intermetallics 120 157 .
David J. Smith & M.R. Mccartney. (2011) Trends in Atomic Resolution Electron Microscopy. MRS Proceedings 332.
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David J. Smith, W.J. de Ruijter, M.R. McCartney & J.K. Weiss. (1993) Progress towards quantitative high-resolution electron microscopy. Ultramicroscopy 52:3-4, pages 591-601.
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D. Hesse, P. Werner, R. Mattheis & J. Heydenreich. (1993) Interfacial reaction barriers during thin-film solid-state reactions: The crystallographic origin of kinetic barriers at the NiS2/Si(111) interface. Applied Physics A Solids and Surfaces 57:5, pages 415-425.
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N. Jedrecy, Y. Zheng, A. Waldhauer, M. Sauvage-Simkin & R. Pinchaux. (1993) Epitaxy of β- on Si(111) . Physical Review B 48:12, pages 8801-8808.
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