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Original Articles

Dislocation contrast in X-ray reflection topography of strained heterostructures

, , , , , , , , , , & show all
Pages 531-548 | Received 19 Dec 1993, Accepted 10 Mar 1994, Published online: 27 Sep 2006

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Viktor S. Kopp & Vladimir M. Kaganer. (2014) X-ray diffraction from hexagonal dislocation networks. Philosophical Magazine 94:28, pages 3247-3258.
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Articles from other publishers (3)

B K Tanner, A M Keir, P Möck, C R Whitehouse, G Lacey, A D Johnson, G W Smith & G F Clark. (1999) X-ray optics of in situ synchrotron topography of InGaAs on GaAs . Journal of Physics D: Applied Physics 32:10A, pages A119-A122.
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J. G. Belk, D. W. Pashley, B. A. Joyce & T. S. Jones. (1998) Dislocation displacement field at the surface of InAs thin films grown on GaAs(110). Physical Review B 58:24, pages 16194-16201.
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B. K. Tanner. 1996. X-Ray and Neutron Dynamical Diffraction. X-Ray and Neutron Dynamical Diffraction 147 166 .

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