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Philosophical Magazine A Volume 72, 1995 - Issue 1
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Original Articles

The effects of surface stress relaxation on electron channelling contrast images of dislocations

Angus J. Wilkinson Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, England
&
Peter B. Hirsch Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, England
Pages 81-103 | Received 09 Sep 1994, Accepted 07 Dec 1994, Published online: 27 Sep 2006

Citations (28)

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Read on this site (4)

Bo Pang, I. P. Jones, Yu-Lung Chiu, J. C. F. Millett & Glenn Whiteman. (2017) Electron channelling contrast imaging of dislocations in a conventional SEM. Philosophical Magazine 97:5, pages 346-359.
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J. Ahmed, S. G. Roberts & A. J. Wilkinson. (2006) Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging. Philosophical Magazine 86:29-31, pages 4965-4981.
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Z.F. Zhang, Z.G. Wang & Y.M. Hu. (2000) Effect of grain size on grain boundary strengthening of copper bicrystals under cyclic loading. Materials Science and Technology 16:2, pages 157-162.
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A. J. Wilkinson. (1997) Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns. Materials Science and Technology 13:1, pages 79-84.
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Articles from other publishers (24)

Shizhao Fan, Rong Liu, Yingnan Huang, Jianxun Liu, Xiaoning Zhan, Xiujian Sun, Meixin Feng, Yuhao Yin, Qian Sun & Hui Yang. (2022) Observation of threading dislocations and misfit dislocation half-loops in GaN/AlGaN heterostructures grown on Si using electron channeling contrast imaging. Journal of Applied Physics 132:10.
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Z. F. Zhang & Z. G. Wang. (2022) Comparison of fatigue lives between grain boundaries and component single crystals of copper bicrystals. International Journal of Materials Research 93:12, pages 1188-1193.
Crossref
Nicolas Brodusch, Salim V. Brahimi, Evelin Barbosa De Melo, Jun Song, Stephen Yue, Nicolas Piché & Raynald Gauvin. (2021) Scanning Electron Microscopy versus Transmission Electron Microscopy for Material Characterization: A Comparative Study on High-Strength Steels. Scanning 2021, pages 1-19.
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S. Cazottes, A. Bechis, C. Lafond, G. L’Hôte, C. Roth, T. Dreyfus, P. Steyer, T. Douillard & C. Langlois. (2019) Toward an automated tool for dislocation density characterization in a scanning electron microscope. Materials Characterization 158, pages 109954.
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Ivan Gutierrez-Urrutia. (2019) Quantitative analysis of electron channeling contrast of dislocations. Ultramicroscopy 206, pages 112826.
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Hana KRIAA, Antoine GUITTON & Nabila MALOUFI. (2019) Modeling Dislocation Contrasts Obtained by Accurate-Electron Channeling Contrast Imaging for Characterizing Deformation Mechanisms in Bulk Materials. Materials 12:10, pages 1587.
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E. Pascal, B. Hourahine, G. Naresh-Kumar, K. Mingard & C. Trager-Cowan. (2018) Dislocation contrast in electron channelling contrast images as projections of strain-like components. Materials Today: Proceedings 5:6, pages 14652-14661.
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M. Ben Saada, N. Gey, B. Beausir, X. Iltis, H. Mansour & N. Maloufi. (2017) Sub-boundaries induced by dislocational creep in uranium dioxide analyzed by advanced diffraction and channeling electron microscopy. Materials Characterization 133, pages 112-121.
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Zheng-Wen Hsiao, Ting-Yi Wu, Delphic Chen, Jui-Chao Kuo & Dong-Yih Lin. (2017) EBSD and electron channeling study of anomalous slip in oligocrystals of high chromium ferritic stainless steel. Micron 94, pages 15-25.
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I. Gutierrez-Urrutia, S. Zaefferer & D. Raabe. (2013) Coupling of Electron Channeling with EBSD: Toward the Quantitative Characterization of Deformation Structures in the SEM. JOM 65:9, pages 1229-1236.
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I. Gutierrez-Urrutia & D. Raabe. (2012) Dislocation density measurement by electron channeling contrast imaging in a scanning electron microscope. Scripta Materialia 66:6, pages 343-346.
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J. D. Caldwell, R. E. Stahlbush & N. A. Mahadik. (2012) Mitigating Defects within Silicon Carbide Epitaxy. Journal of The Electrochemical Society 159:3, pages R46-R51.
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RANGA J. KAMALADASA, FANG LIU, LISA M. PORTER, ROBERT F. DAVIS, DANIEL D. KOLESKE, GREG MULHOLLAND, KENNETH A. JONES & YOOSUF N. PICARD. (2011) Identifying threading dislocations in GaN films and substrates by electron channelling. Journal of Microscopy 244:3, pages 311-319.
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Y.N. Picard, M.E. Twigg, J.D. Caldwell, C.R. EddyJr.Jr., M.A. Mastro & R.T. Holm. (2009) Resolving the Burgers vector for individual GaN dislocations by electron channeling contrast imaging. Scripta Materialia 61:8, pages 773-776.
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M. E. Twigg & Y. N. Picard. (2009) Simulation and analysis of electron channeling contrast images of threading screw dislocations in 4H-SiC. Journal of Applied Physics 105:9.
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Yoosuf N. Picard & Mark E. Twigg. (2008) Diffraction contrast and Bragg reflection determination in forescattered electron channeling contrast images of threading screw dislocations in 4H-SiC. Journal of Applied Physics 104:12.
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Y. N. Picard, J. D. Caldwell, M. E. Twigg, C. R. EddyJr.Jr., M. A. Mastro, R. L. Henry, R. T. Holm, P. G. Neudeck, A. J. Trunek & J. A. Powell. (2007) Nondestructive analysis of threading dislocations in GaN by electron channeling contrast imaging. Applied Physics Letters 91:9.
Crossref
Z. F. Zhang & Z. G. Wang. (2002) Comparison of fatigue lives between grain boundaries and component single crystals of copper bicrystals. Zeitschrift für Metallkunde 93:12, pages 1188-1193.
Crossref
Z.F. Zhang & Z.G. Wang. (2000) Comparison of fatigue cracking possibility along large- and low-angle grain boundaries. Materials Science and Engineering: A 284:1-2, pages 285-291.
Crossref
Z.F Zhang & Z.G Wang. (1999) Cyclic deformation features of a copper bicrystal with an embedded grain and surrounding grain boundary. Materials Science and Engineering: A 271:1-2, pages 449-457.
Crossref
B.-C. Ng, B.A. Simkin & M.A. Crimp. (1997) Electron channeling contrast imaging of dislocation structures in deformed stoichiometric NiAl. Materials Science and Engineering: A 239-240, pages 150-156.
Crossref
Angus J. Wilkinson & Peter B. Hirsch. (1997) Electron diffraction based techniques in scanning electron microscopy of bulk materials. Micron 28:4, pages 279-308.
Crossref
A. J. Wilkinson. (1997) Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns. Materials Science and Technology 13:1, pages 79-84.
Crossref
B-C. Ng, B. Simkin & M. A. Crimp. (2011) Examination of Dislocation Structures Near Crack TIP Region of B2 NiAl Alloys. MRS Proceedings 460.
Crossref

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