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Original Articles

Electron channelling: A method in real-space crystallography and a comparison with the atomic location by channelling-enhanced microanalysis

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Pages 165-186 | Received 07 Mar 1994, Accepted 05 May 1994, Published online: 27 Sep 2006

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D.H. Hou, I.P. Jones & H.L. Fraser. (1996) The ordering tie-line method for sublattice occupancy in intermetallic compounds. Philosophical Magazine A 74:3, pages 741-760.
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C.J. Rossouw, C.T. Forwood, M.A. Gibson & P.R. Miller. (1996) Zone-axis convergent-beam electron diffraction and ALCHEMI analysis of Ti[sbnd]Al alloys with ternary additions. Philosophical Magazine A 74:1, pages 77-102.
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C.J. Rossouw, C.T. Forwood, M.A. Gibson & P.R. Miller. (1996) Statistical ALCHEMI: Aeneral formulation and method with application to Ti[sbnd]Al ternary alloys. Philosophical Magazine A 74:1, pages 57-76.
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Articles from other publishers (26)

Petr Kratochvíl, Robert Král, Stanislav Daniš, Josef Pešička, Peter Minárik & Jozef Veselý. (2022) Atom Location by Channeling-Enhanced Microanalysis (ALCHEMI) Study of Structure of Complex Concentrated Alloys Derived From FeAl Iron Aluminide. Metallurgical and Materials Transactions A 53:11, pages 3968-3976.
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P. Schattschneider, C. Hébert & M. Stöger-Pollach. (2022) Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis. International Journal of Materials Research 97:7, pages 920-927.
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Yu Yamamoto, Masahiro Ohtsuka, Yosuke Azuma, Teruo Takahashi & Shunsuke Muto. (2018) Cation mixing in LiNi0.8Co0.15Al0.05O2 positive electrode material studied using high angular resolution electron channeling X-ray spectroscopy. Journal of Power Sources 401, pages 263-270.
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NICOLAS BRODUSCH & RAYNALD GAUVIN. (2017) The qualitative f-ratio method applied to electron channelling-induced x-ray imaging with an annular silicon drift detector in a scanning electron microscope in the transmission mode. Journal of Microscopy 267:3, pages 288-298.
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Matthias Meffert, Heike Störmer & Dagmar Gerthsen. (2015) Dopant-Site Determination in Y- and Sc-Doped (Ba 0.5 Sr 0.5 )(Co 0.8 Fe 0.2 )O 3− δ by Atom Location by Channeling Enhanced Microanalysis and the Role of Dopant Site on Secondary Phase Formation . Microscopy and Microanalysis 22:1, pages 113-121.
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Jozef Veselý, Miroslav Cieslar & Margarita Slámová. (2009) ALCHEMI study of chromium doped iron-aluminides. International Journal of Materials Research 100:6, pages 811-813.
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P. Schattschneider, C. Hébert & M. Stöger-Pollach. (2006) Electron energy-loss spectrometry for metals: some thoughts beyond microanalysis. International Journal of Materials Research 97:7, pages 920-927.
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Takao Morimura & Masayuki Hasaka. (2006) ALCHEMI for coexistent Heusler and half-Heusler phases in TiNi1.5Sn. Ultramicroscopy 106:7, pages 553-560.
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Wilfried Sigle. (2005) ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY. Annual Review of Materials Research 35:1, pages 239-314.
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Takao Morimura & Masayuki Hasaka. (2005) Electron channeling X-ray microanalysis for partially filled skutterudite structure. Micron 36:5, pages 429-435.
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T Morimura & M Hasaka. (2004) Electron channeling X-ray microanalysis for site occupation in β-FeSi2 doped with Co. Materials Characterization 52:1, pages 35-41.
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I.P. Jones. 2003. 63 I .
L. J. Allen & M. P. Oxley. (2020) Teoretical Tools for Practical ALCHEMI. Microscopy and Microanalysis 7:S2, pages 348-349.
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M.P Oxley & L.J Allen. (1999) Impact parameters for ionization by high-energy electrons. Ultramicroscopy 80:2, pages 125-131.
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M.P Oxley, L.J Allen & C.J Rossouw. (1999) Correction terms and approximations for atom location by channelling enhanced microanalysis. Ultramicroscopy 80:2, pages 109-124.
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M. P. Oxley & L. J. Allen. (1998) Delocalization of the effective interaction for inner-shell ionization in crystals. Physical Review B 57:6, pages 3273-3282.
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A. Gupta, G. C. Weatherly, Daniel T. Cassidy & D. M. Bruce. (1997) Characterization and modelling of the strain fields associated with InGaAs layers on V-grooved InP substrates. Journal of Applied Physics 82:12, pages 6016-6023.
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C.A. Mullan, G.C. Weatherly & D.A. Thompson. (1997) Compositional variations in InGaAsP films grown on patterned substrates. Journal of Crystal Growth 182:3-4, pages 266-274.
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A. J. Forsyth, A. E. Smith & T. W. Josefsson. (1997) Anisotropy in the electron inelastic scattering potential for plasmon excitation in silicon. Physical Review B 56:11, pages 6400-6403.
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L. J. Allen, D. C. Bell, T. W. Josefsson, A. E. C. Spargo & S. L. Dudarev. (1997) Inner-shell ionization cross sections and aperture size in electron energy-loss spectroscopy. Physical Review B 56:1, pages 9-11.
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C.J. Rossouw, C.T. Forwood, M.A. Gibson & P.R. Miller. (1997) Generation and absorption of characteristic X-rays under dynamical electron diffraction conditions. Micron 28:2, pages 125-137.
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T. Okada, G. C. Weatherly & D. W. McComb. (1997) Growth of strained InGaAs layers on InP substrates. Journal of Applied Physics 81:5, pages 2185-2196.
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Ludwig ReimerLudwig Reimer. 1997. Transmission Electron Microscopy. Transmission Electron Microscopy 423 461 .
W. Sigle. (1996) Focused high-voltage electron beams in material science. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 113:1-4, pages 88-92.
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T. W. Josefsson & L. J. Allen. (1996) Diffraction and absorption of inelastically scattered electrons for K -shell ionization . Physical Review B 53:5, pages 2277-2285.
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L. J. Allen & T. W. Josefsson. (1995) Inelastic scattering of fast electrons by crystals. Physical Review B 52:5, pages 3184-3198.
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