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Philosophical Magazine A Volume 71, 1995 - Issue 6
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Original Articles

Radiation damage of Ni3Al by 100 keV electrons

David A. Muller Physics Department, Cornell University, Ithaca, New York, 14853, USA
&
John Silcox School of Applied and Engineering Physics, Cornell University, Ithaca, New York, 14853, USA
Pages 1375-1387 | Received 22 Jun 1994, Accepted 08 Dec 1994, Published online: 04 Oct 2006

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F. Gao, D. J. Bacon, W. S. Lai & R. J. Kurtz. (2006) Low-energy sputtering events at free surfaces near anti-phase and grain boundaries in Ni3Al. Philosophical Magazine 86:27, pages 4243-4258.
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B. B. Tang , I. P. Jones, W. S. Lai & D. J. Bacon. (2005) Sputtering-induced nanometre hole formation in Ni3Al under intense electron beam irradiation. Philosophical Magazine 85:17, pages 1805-1817.
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W. S. Lai , Y. N. Osetsky & D. J. Bacon . (2005) Point-defect properties of, and sputtering events in, the {001} surfaces of Ni3Al. II. Sputtering events at and near surfaces. Philosophical Magazine 85:16, pages 1687-1700.
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Articles from other publishers (44)

Sean H. Mills, Steven E. Zeltmann, Peter Ercius, Aaron A. Kohnert, Blas P. Uberuaga & Andrew M. Minor. (2023) Nanoscale mapping of point defect concentrations with 4D-STEM. Acta Materialia 246, pages 118721.
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Martha Ilett, Mark S'ari, Helen Freeman, Zabeada Aslam, Natalia Koniuch, Maryam Afzali, James Cattle, Robert Hooley, Teresa Roncal-Herrero, Sean M. Collins, Nicole Hondow, Andy Brown & Rik Brydson. (2020) Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 378:2186, pages 20190601.
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Rob Hooley, Andy Brown & Rik Brydson. (2019) Factors affecting electron beam damage in calcite nanoparticles. Micron 120, pages 25-34.
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R.F. Egerton. (2019) Radiation damage to organic and inorganic specimens in the TEM. Micron 119, pages 72-87.
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Shu Fen TanShu Fen Tan. 2018. Molecular Electronic Control Over Tunneling Charge Transfer Plasmons Modes. Molecular Electronic Control Over Tunneling Charge Transfer Plasmons Modes 69 82 .
Ye Zhu, Philip N. H. Nakashima, Alison M. Funston, Laure Bourgeois & Joanne Etheridge. (2017) Topologically Enclosed Aluminum Voids as Plasmonic Nanostructures. ACS Nano 11:11, pages 11383-11392.
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Hui Qian & Ray F. Egerton. (2017) Solid-state nanopores of controlled geometry fabricated in a transmission electron microscope. Applied Physics Letters 111:19.
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Shu Fen Tan, Michel Bosman & Christian A. Nijhuis. (2017) Molecular Coatings for Stabilizing Silver and Gold Nanocubes under Electron Beam Irradiation. Langmuir 33:5, pages 1189-1196.
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Suji Choi, Jong Hoon Lee, Min Wook Pin, Dong Won Jang, Seong-Gu Hong, Boklae Cho, Sang Jun Lee, Jong Seok Jeong, Seong-Hoon Yi & Young Heon Kim. (2017) Study on fracture behavior of individual InAs nanowires using an electron-beam-drilled notch. RSC Advances 7:27, pages 16655-16661.
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Aaron C. Johnston-Peck, Joseph S. DuChene, Alan D. Roberts, Wei David Wei & Andrew A. Herzing. (2016) Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope. Ultramicroscopy 170, pages 1-9.
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M. Sina, N. Pereira, G. G. Amatucci & F. Cosandey. (2016) Microstructural Evolution Of Iron Oxyfluoride/Carbon Nanocomposites Upon Electrochemical Cycling. The Journal of Physical Chemistry C 120:25, pages 13375-13383.
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Barnaby D.A. Levin & David A. Muller. (2015) Challenges for ABF-STEM characterization of Li battery materials. Microscopy and Microanalysis 21:S3, pages 1549-1550.
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R.F. Egerton. (2014) Choice of operating voltage for a transmission electron microscope. Ultramicroscopy 145, pages 85-93.
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R.F. Egerton. (2013) Control of radiation damage in the TEM. Ultramicroscopy 127, pages 100-108.
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Xiongyao Wang, Ross Lockwood, Doug Vick, Peng Li, Al Meldrum & Marek Malac. (2012) A convenient method for electron tomography sample preparation using a focused ion beam. Microscopy Research and Technique 75:9, pages 1165-1169.
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L. M. Brown. 2011. Aberration‐Corrected Analytical Transmission Electron Microscopy. Aberration‐Corrected Analytical Transmission Electron Microscopy 39 53 .
R.F. EgertonR.F. Egerton. 2011. Electron Energy-Loss Spectroscopy in the Electron Microscope. Electron Energy-Loss Spectroscopy in the Electron Microscope 293 397 .
R. Hübner, H.-J. Engelmann & E. Zschech. (2010) Challenges to quantitative energy-dispersive X-ray spectrometry and its application to graded embedded silicon–germanium for high-performance complementary metal oxide semiconductor devices. Thin Solid Films 519:1, pages 203-209.
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N. Jiang. 2010. Advances in Materials Science for Environmental and Nuclear Technology. Advances in Materials Science for Environmental and Nuclear Technology 127 132 .
Gianluigi A. Botton, Sorin Lazar & Christian Dwyer. (2010) Elemental mapping at the atomic scale using low accelerating voltages. Ultramicroscopy 110:8, pages 926-934.
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R.F. Egerton, R. McLeod, F. Wang & M. Malac. (2010) Basic questions related to electron-induced sputtering in the TEM. Ultramicroscopy 110:8, pages 991-997.
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W.S. Lai, J.J. Yu, F. Gao & D.J. Bacon. (2009) Computer simulation of sputtering at the low index (100), (110) and (111) surfaces of Ni3Al in a STEM. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 267:18, pages 3076-3079.
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Nan Jiang & John C. H. Spence. (2009) Radiation damage in zircon by high-energy electron beams. Journal of Applied Physics 105:12.
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Peter Ercius, Lynne M. Gignac, C.-K. Hu & David A. Muller. (2009) Three-Dimensional Measurement of Line Edge Roughness in Copper Wires Using Electron Tomography. Microscopy and Microanalysis 15:3, pages 244-250.
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David A. Muller. (2009) Structure and bonding at the atomic scale by scanning transmission electron microscopy. Nature Materials 8:4, pages 263-270.
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K.A. Mkhoyan, S.E. Maccagnano-Zacher, E.J. Kirkland & J. Silcox. (2008) Effects of amorphous layers on ADF-STEM imaging. Ultramicroscopy 108:8, pages 791-803.
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D. G. Howitt, S. J. Chen, B. C. Gierhart, R. L. Smith & S. D. Collins. (2008) The electron beam hole drilling of silicon nitride thin films. Journal of Applied Physics 103:2.
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Sara Maccagnano-Zacher, Andre Mkhoyan & John Silcox. (2011) Reduction of Contrast in ADF-STEM Images Due To Amorphous Layer. MRS Proceedings 1026.
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Aycan Yurtsever, Matthew Weyland & David A. Muller. (2006) Three-dimensional imaging of nonspherical silicon nanoparticles embedded in silicon oxide by plasmon tomography. Applied Physics Letters 89:15.
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W. Lai, A. Barashev & D. Bacon. (2004) Multiscale modeling of surface sputtering in a scanning transmission electron microscope. Physical Review B 70:19.
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Danièle Bouchet & Christian Colliex. (2003) Experimental study of ELNES at grain boundaries in alumina: intergranular radiation damage effects on Al-L23 and O-K edges. Ultramicroscopy 96:2, pages 139-152.
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K. A. Mkhoyan & J. Silcox. (2003) Electron-beam-induced damage in wurtzite InN. Applied Physics Letters 82:6, pages 859-861.
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Nan Jiang & John Silcox. (2002) Electron irradiation induced phase decomposition in alkaline earth multi-component oxide glass. Journal of Applied Physics 92:5, pages 2310-2316.
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D. A. Pankhurst, G. A. Botton & C. J. Humphreys. (2001) Local symmetry and bonding effects on electron energy-loss near-edge structures: Ab initio study of an NiAl grain boundary . Physical Review B 63:20.
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J. Silcox. (2020) Electron Scattering with an Atomic Sized Probe. Microscopy and Microanalysis 6:S2, pages 102-103.
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Nan Jiang & John Silcox. (2000) Observations of reaction zones at chromium/oxide glass interfaces. Journal of Applied Physics 87:8, pages 3768-3776.
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A. Maiti, S. T. Pantelides, M. F. Chisholm & S. J. Pennycook. (1999) Damage nucleation and vacancy-induced structural transformation in Si grain boundaries. Applied Physics Letters 75:16, pages 2380-2382.
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David A. Muller, Philip E. Batson & John Silcox. (1998) Measurement and models of electron-energy-loss spectroscopy core-level shifts in nickel aluminum intermetallics. Physical Review B 58:18, pages 11970-11981.
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Wilson Ho. (1998) Inducing and Viewing Bond Selected Chemistry with Tunneling Electrons. Accounts of Chemical Research 31:9, pages 567-573.
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John Silcox. (1998) Core-loss EELS. Current Opinion in Solid State and Materials Science 3:4, pages 336-342.
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David A. Muller, David J. Singh & John Silcox. (1998) Connections between the electron-energy-loss spectra, the local electronic structure, and the physical properties of a material: A study of nickel aluminum alloys. Physical Review B 57:14, pages 8181-8202.
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D.A. Muller, S. Subramanian, P.E. Batson, J. Silcox & S.L. Sass. (1996) Structure, chemistry and bonding at grain boundaries in Ni3Al—I. The role of boron in ductilizing grain boundaries. Acta Materialia 44:4, pages 1637-1645.
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D. ÖZKAYA, J. YUAN, L. M. BROWN & P. E. J. FLEWITT. (1995) Segregation-induced hole drilling at grain boundaries. Journal of Microscopy 180:3, pages 300-306.
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David A. Muller, Shanthi Subramanian, Philip E. Batson, Stephen L. Sass & John Silcox. (1995) Near Atomic Scale Studies of Electronic Structure at Grain Boundaries in N Al . Physical Review Letters 75:26, pages 4744-4747.
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