9
Views
14
CrossRef citations to date
0
Altmetric
Original Articles

On the structural, optical and electronic properties of microcrystalline Si:O:C:H thin films prepared in a two-consecutive-decomposition-deposition-chamber system

&
Pages 79-86 | Received 01 May 1990, Accepted 15 Jun 1990, Published online: 20 Aug 2006

Keep up to date with the latest research on this topic with citation updates for this article.

Read on this site (2)

R. Martins, A. Maçarico, M. Vieira, I. Ferreira & E. Fortunato. (1997) Structure, composition and electro-optical properties of n-type amorphous and microcrystalline silicon thin films. Philosophical Magazine B 76:3, pages 249-258.
Read now
F. Demichelis, C.F. Pirri & E. Tresso. (1992) Microcrystallization formation in silicon carbide thin films. Philosophical Magazine B 66:1, pages 135-146.
Read now

Articles from other publishers (12)

U. Coscia, G. Ambrosone, D. K. Basa, E. Tresso, A. Chiodoni, N. Pinto & R. Murri. (2010) Morphological and structural modifications induced in a-Si1−x C x :H films by excimer laser annealing. Applied Physics A 100:4, pages 1163-1168.
Crossref
U. Coscia, G. Ambrosone, S. Lettieri, P. Maddalena, V. Rigato, S. Restello, E. Bobeico & M. Tucci. (2005) Preparation of microcrystalline silicon–carbon films. Solar Energy Materials and Solar Cells 87:1-4, pages 433-444.
Crossref
G Ambrosone, G Barucca, U Coscia, S Ferrero, S Lettieri & P Maddalena. (2004) Deposition of microcrystalline silicon–carbon alloys in low power regime. Journal of Non-Crystalline Solids 338-340, pages 163-167.
Crossref
U. Coscia, G. Ambrosone, C. Minarini, V. Parisi, S. Schutzmann, A. Tebano, S. Restello & V. Rigato. (2004) Laser annealing of hydrogenated amorphous silicon–carbon films. Thin Solid Films 453-454, pages 7-12.
Crossref
U. Coscia, G. Ambrosone, S. Lettieri, P. Maddalena, P. Rava & C. Minarini. (2003) Power density effects on the growth of microcrystalline silicon–carbon alloys by PECVD. Thin Solid Films 427:1-2, pages 284-288.
Crossref
R. Martins, I. Ferreira, E. Fortunato & M. Vieira. (2011) Silicon Oxycarbide Microcrystalline Layers Produced by Spatial Separation Techniques. MRS Proceedings 336.
Crossref
F. Demichelis, C. F. Pirri & E. Tresso. (1992) Influence of doping on the structural and optoelectronic properties of amorphous and microcrystalline silicon carbide. Journal of Applied Physics 72:4, pages 1327-1333.
Crossref
F. Demichelis, C.F. Pirri, E. Tresso, G. DellaMea, A. Quaranta, V. Rigato, M. Ferraris & P. Rava. (2011) Influence of Carbon on Structural, Optical and Electrical Properties of Microcrystalline Silicon Carbide.. MRS Proceedings 258.
Crossref
R. Martins, I. Ferreira, C. N. Carvalho, A. Maçarico & L. Guimarães. (2011) Engineering of PECVD Systems for Macroelectronic Applications. MRS Proceedings 258.
Crossref
F. Demichelis, C. F. Pirri, E. Tresso, L. Battezzati, E. Giamello & P. Menna. (2011) Crystallization Processes in Amorphous Hydrogenated Silicon Based Alloys. MRS Proceedings 230.
Crossref
F. Demichelis, C. F. Pirri, E. Tresso, G. Dellamea, V. Rigato & P. Rava. (2011) Physical Properties of Undoped and Doped Microcrystalline SiC:H Deposited by PECVD. MRS Proceedings 219.
Crossref
Roberto Balboni & Stefano Frabboni. (1991) CBED strain measurements in boron implanted silicon. Microscopy Microanalysis Microstructures 2:6, pages 617-626.
Crossref

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.