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Journal of Applied Statistics Volume 32, 2005 - Issue 10
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Original Articles

Testing process capability based on Cpm in the presence of random measurement errors

W. L. Pearn Department of Industrial Engineering & Management, National Chiao Tung University
,
M. H. Shu Department of Industrial Engineering & Management, National Kaohsiung University of Applied SciencesCorrespondence[email protected]
&
B. M. Hsu Department of Industrial Engineering & Management, Cheng Shiu University, Taiwan
Pages 1003-1024 | Published online: 20 Aug 2006

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Dwi Yuli Rakhmawati & Kwang-Jae Kim. (2022) Performance comparison of generalized confidence interval and modified sampling distribution approaches for assessing one-sided capability indices with gauge measurement errors. Communications in Statistics - Theory and Methods 51:3, pages 685-700.
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Chien-Che Huang, Tsang-Chuan Chang & Bae-Ling Chen. (2021) Fuzzy assessment model to judge quality level of machining processes involving bilateral tolerance using crisp data. Journal of the Chinese Institute of Engineers 44:1, pages 1-10.
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Dwi Yuli Rakhmawati, Chien-Wei Wu & Chao-Lung Yang. (2016) Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors. Communications in Statistics - Theory and Methods 45:10, pages 3011-3026.
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Chien-Wei Wu. (2013) Process performance evaluation based on Taguchi capability index with the consideration of measurement errors. International Journal of Systems Science 44:8, pages 1386-1399.
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Chien-Wei Wu. (2011) Using a novel approach to assess process performance in the presence of measurement errors. Journal of Statistical Computation and Simulation 81:3, pages 301-314.
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Michele Scagliarini. (2010) Inference on C pk for autocorrelated data in the presence of random measurement errors. Journal of Applied Statistics 37:1, pages 147-158.
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Articles from other publishers (22)

Robert Wilson. (2023) The application of capability indices in the validation of ELISA methodology. Bioanalysis 15:21, pages 1277-1286.
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Doraid Dalalah. (2023) Evaluation of gauges in measurement systems. Production Engineering.
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Tsang-Chuan Chang. (2022) Fuzzy process capability analysis for machined product with multiple characteristics of symmetric tolerance. Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture 237:5, pages 691-702.
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Robab Afshari, Adel Ahmadi Nadi, Arne Johannssen, Nataliya Chukhrova & Kim Phuc Tran. (2022) The effects of measurement errors on estimating and assessing the multivariate process capability with imprecise characteristic. Computers & Industrial Engineering 172, pages 108563.
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Tsang-Chuan Chang & Kuen-Suan Chen. (2022) Statistical Test of Two Taguchi Six-Sigma Quality Indices to Select the Supplier with Optimal Processing Quality. Journal of Testing and Evaluation 50:1, pages 20210016.
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Alexis Oliva & Matías Llabrés. 2021. Quality Control - Intelligent Manufacturing, Robust Design and Charts. Quality Control - Intelligent Manufacturing, Robust Design and Charts.
Chia Huang Wu, Ya Chen Hsu & Wen Lea Pearn. (2020) An improved measure of quality loss for notching processes. Quality and Reliability Engineering International 37:1, pages 108-122.
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Zsolt Tibor Kosztyán & Attila Imre Katona. (2018) Risk-Based X-bar chart with variable sample size and sampling interval. Computers & Industrial Engineering 120, pages 308-319.
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Robert Wilson. (2018) Design of experiment in assessing robustness and for qualification of a cell-based potency assay. Bioanalysis 10:10, pages 737-746.
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Sarra Selmi, Souha Ben Amara, Nabil Ben Fredj, Abdessamad Kobi & Imed Ben Salah. (2017) Process capability indices and X ¯ $$ \overline{X} $$ , R control chart limit adjustments by taking into account measurement system errors. The International Journal of Advanced Manufacturing Technology 95:5-8, pages 1919-1930.
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Mohammad Reza Maleki, Amirhossein Amiri & Philippe Castagliola. (2017) Measurement errors in statistical process monitoring: A literature review. Computers & Industrial Engineering 103, pages 316-329.
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Fu-Kwun Wang. (2016) Process Yield Analysis for Nonlinear Profiles in the Presence of Gauge Measurement Errors. Quality and Reliability Engineering International 32:7, pages 2435-2442.
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Doraid Dalalah & Dania Bani Hani. (2016) A precision-to-tolerance ratio model for the assessment of measurements uncertainty. Precision Engineering 44, pages 143-151.
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Doraid Dalalah & Dania Bani Hani. (2016) On the actual and observed process capability indices: A signal-to-noise ratio model. Measurement 81, pages 241-250.
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Alexis Oliva, Matías Llabrés & José B. Fariña. (2014) Capability measurement of size-exclusion chromatography with a light-scattering detection method in a stability study of bevacizumab using the process capability indices. Journal of Chromatography A 1353, pages 89-98.
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Chien-Wei Wu, Mou-Yuan Liao & Chung-Yang Lin. (2013) On ranking multiple touch-screen panel suppliers through the CTQ: applied fuzzy techniques for inspection with unavoidable measurement errors. Neural Computing and Applications 25:2, pages 481-490.
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Srinivas Jallepalli, Anadi Srivastava, Robin Wyllie & Surya Veeraraghavan. (2013) Compliance Metrics for a Reliable Assessment of Parametric Yield. IEEE Transactions on Semiconductor Manufacturing 26:3, pages 385-392.
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D. Grau. (2013) Testing capability indices for one-sided processes with measurement errors. International Journal of Metrology and Quality Engineering 4:2, pages 71-80.
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Chien-Wei Wu & Mou-Yuan Liao. (2012) Generalized Inference for Measuring Process Yield With the Contamination of Measurement Errors—Quality Control for Silicon Wafer Manufacturing Processes in the Semiconductor Industry. IEEE Transactions on Semiconductor Manufacturing 25:2, pages 272-283.
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Michele Scagliarini. (2011) Multivariate process capability using principal component analysis in the presence of measurement errors. AStA Advances in Statistical Analysis 95:2, pages 113-128.
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D. Grau. (2011) Testing capability indices for manufacturing processes with asymmetric tolerance limits and measurement errors. International Journal of Metrology and Quality Engineering 2:1, pages 61-73.
Crossref
Fu-Kwun Wang. (2008) Process Yield With Measurement Errors in Semiconductor Manufacturing. IEEE Transactions on Semiconductor Manufacturing 21:2, pages 279-284.
Crossref

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