X-ray diffraction analysis of the layer structure in a ferroelectric liquid crystal with a chiral nematic–chiral smectic C phase transition

Ray Hasegawa Corresponding author Display Materials and Devices Laboratory, Corporate Research & Development Center, Toshiba Corporation, 1, Komukai Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan

Aira Hotta Display Materials and Devices Laboratory, Corporate Research & Development Center, Toshiba Corporation, 1, Komukai Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan

Kohki Takatoh Display Materials and Devices Laboratory, Corporate Research & Development Center, Toshiba Corporation, 1, Komukai Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan

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X-ray diffraction analysis of the layer structure in a ferroelectric liquid crystal with a chiral nematic–chiral smectic C phase transition

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X-ray diffraction analysis of the layer structure in a ferroelectric liquid crystal with a chiral nematic–chiral smectic C phase transition

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