Ferrielectric six-layer () and several electric-field-induced subphases in AS657 studied by complementary methods, electric-field-induced birefringence and microbeam resonant X-ray scattering

A. D. L. Chandani PereraDepartment of Electronic and Electrical Engineering, Trinity College Dublin, University of Dublin, Dublin 2, Ireland;Department of Chemistry, University of Peradeniya, Peradeniya, Sri LankaView further author information

Atsuo FukudaDepartment of Electronic and Electrical Engineering, Trinity College Dublin, University of Dublin, Dublin 2, IrelandView further author information

Jagdish K. VijDepartment of Electronic and Electrical Engineering, Trinity College Dublin, University of Dublin, Dublin 2, IrelandCorrespondence[email protected] [email protected]
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Yoichi TakanishiDepartment of Physics, Kyoto University, Kyoto, JapanView further author information

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Ferrielectric six-layer () and several electric-field-induced subphases in AS657 studied by complementary methods, electric-field-induced birefringence and microbeam resonant X-ray scattering

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Ferrielectric six-layer () and several electric-field-induced subphases in AS657 studied by complementary methods, electric-field-induced birefringence and microbeam resonant X-ray scattering

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