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Communications in Statistics - Theory and Methods Volume 17, 1988 - Issue 1
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Original Articles

Selecting more reliable weibull populations than a control

Sheng-Tsaing Tseng Department of Industrial Management and Technology, National Taiwan Institute of Technology, Taipei, 10772, Taiwan
Pages 169-181 | Received 01 Apr 1987, Published online: 27 Jun 2007

Citations (11)

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Read on this site (4)

Hong-Fwu Yu. (2007) OPTIMAL SELECTION OF THE MOST RELIABLE DESIGN WITH A RECIPROCAL WEIBULL DEGRADATION RATE. Journal of the Chinese Institute of Industrial Engineers 24:1, pages 60-69.
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Hong-Fwu Yu & Wen-Ching Yu. (2006) OPTIMAL CLASSIFICATION OF HIGHLY RELIABLE PRODUCTS WITH A LINEARIZED DEGRADATION MODEL. Journal of the Chinese Institute of Industrial Engineers 23:5, pages 382-392.
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Hong-Fwu Yu. (2003) Optimal Classification Of Highly-Reliable Products Whose Degradation Paths Satisfy Wiener Processes. Engineering Optimization 35:3, pages 313-324.
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Hong-Fwu Yu. (2002) Optimal selection of the most reliable product with degradation data. Engineering Optimization 34:6, pages 579-590.
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Articles from other publishers (7)

Hong‐Fwu Yu. (2003) Optimal selection of the most reliable design whose degradation path satisfies a Wiener process. International Journal of Quality & Reliability Management 20:9, pages 1084-1095.
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LOON CHING TANG & YESHENG SUN. (2011) SELECTING THE MOST RELIABLE POPULATION UNDER STEP-STRESS ACCELERATED LIFE TEST. International Journal of Reliability, Quality and Safety Engineering 06:04, pages 347-359.
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A.N. Gill & G.P. Mehta. (1994) A class of subset selection procedures for Weibull populations. IEEE Transactions on Reliability 43:1, pages 65-70.
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D.-S. Chang, D.-Y. Huang & S.-T. Tseng. (1992) Selecting the most reliable design under type-II censored accelerated testing. IEEE Transactions on Reliability 41:4, pages 588-592.
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Tong-You Wu & Sheng-Tsaing Tseng. (1992) MLR rule for selecting the most reliable design. Reliability Engineering & System Safety 38:3, pages 237-243.
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Sheng-Tsaing Tseng & H.-J. Wu. (1990) Selecting, under type-II censoring, Weibull populations that are more reliable. IEEE Transactions on Reliability 39:2, pages 193-198.
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Sheng-Tsaing Tseng & Dong-Shang Chang. (1989) Selecting the most reliable design under type-II censoring. Reliability Engineering & System Safety 25:2, pages 147-156.
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