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IETE Journal of Research Volume 43, 1997 - Issue 6
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Original Articles

New Dynamic Test Methods for Determination of Nonlinearity and Effective Resolution of A/D Converters

D K MishraDepartment of Electronics and Instrumentation Engineering, Shri G S Institute of Technology and Science, 23, Park Road, Indore452 003, India.
, MIETE,
M C ShrivastavaDepartment of Electronics and Instrumentation Engineering, Shri G S Institute of Technology and Science, 23, Park Road, Indore452 003, India.
, FIETE &
N S ChaudhariSchool of Computer Science, Institute of Computer Science, Electronics and Instrumentation, Devi Ahilya Vishvavidyalaya, Khandwa Road Campus, Indore452 001, India.
, MIETE
Pages 403-409 | Received 08 Oct 1996, Published online: 26 Mar 2015

Citations (7)

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Read on this site (4)

R.S. Gamad & D.K. Mishra. (2011) Code transition error effects on estimation of nonlinearity and ENOB of an A/D converter. International Journal of Electronics 98:11, pages 1503-1515.
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R.S. Gamad & D.K. Mishra. (2009) Determination of error in nonlinearity estimation in an A/D converter with triangular wave input. International Journal of Electronics 96:12, pages 1237-1247.
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U. B. S. Chandrawat & D. K. Mishra. (2007) Fast settling opamp with low power consumption. International Journal of Electronics 94:7, pages 683-698.
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D. K. Mishra. (2003) ADC testing using interpolated fast Fourier transform (IFFT) technique . International Journal of Electronics 90:7, pages 459-469.
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Articles from other publishers (3)

Bhawana Garg & Deepak K. Mishra. (2014) Characterization of Analog to Digital converter using Histogram method with noise as stimuli. Characterization of Analog to Digital converter using Histogram method with noise as stimuli.
Radhe Shyam Gamad & Deepak Kumar Mishra. (2011) Computation of Error in Estimation of Nonlinearity in ADC Using Histogram Technique. Engineering 03:06, pages 583-587.
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R.S. Gamad & D.K. Mishra. (2009) Gain error, offset error and ENOB estimation of an A/D converter using histogram technique. Measurement 42:4, pages 570-576.
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