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Ferroelectrics Letters Section Volume 21, 1996 - Issue 1-2
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Original Articles

Multilayer capacitor margin stresses and electrode to dielectric thickness calculations

William Carlson New York State College of Ceramics, Alfred, NY, 14802
,
Truman Rutt AVX Corporate Research Laboratory, Myrtle Beach, SC, 29578
&
Michael Wild New York State College of Ceramics, Alfred, NY, 14802
Pages 1-9 | Received 03 Jun 1995, Accepted 03 Jan 1996, Published online: 17 Aug 2006

Citations (4)

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Read on this site (1)

R. Al-Saffar, R. Freer, I. Tribick & P. Ward. (1999) Flexure strength of multilayer ceramic capacitors. British Ceramic Transactions 98:5, pages 241-245.
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Articles from other publishers (3)

Yukie Nakano, Daisuke Iwanaga, Takako Hibi, Mari Miyauchi & Takeshi Nomura. 2006. Recent Developments in Electronic Materials and Devices. Recent Developments in Electronic Materials and Devices 233 244 .
Yukie Nakano, Takeshi Nomura & Tadashi Takenaka. (2003) Residual Stress of Multilayer Ceramic Capacitors (MLCCs). Key Engineering Materials 248, pages 179-182.
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Chun-Hway Hsueh & Mattison K. Ferber. (2002) Apparent coefficient of thermal expansion and residual stresses in multilayer capacitors. Composites Part A: Applied Science and Manufacturing 33:8, pages 1115-1121.
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