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IIE Transactions Volume 24, 1992 - Issue 5
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Special Issue on Quality in Production

OPTIMAL BURN-IN SIMULATION ON HIGHLY INTEGRATED CIRCUIT SYSTEMS

WEI-TING KARY CHIEN Department of Industrial and Manufacturing Systems Engineering, Iowa State University, Ames, IA, 50011
&
WAY KUO Department of Industrial and Manufacturing Systems Engineering, Iowa State University, Ames, IA, 50011
Pages 33-43 | Published online: 30 May 2007

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KyungmeeO. Kim & Way Kuo. (2011) Component and system burn-in for repairable systems. IIE Transactions 43:11, pages 773-782.
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Articles from other publishers (11)

Kyungmee O. Kim & Way Kuo. (2009) Optimal burn-in for maximizing reliability of repairable non-series systems. European Journal of Operational Research 193:1, pages 140-151.
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Kyungmee O. Kim & Hee-Seok Oh. (2008) Reliability functions estimated from commonly used yield models. Microelectronics Reliability 48:3, pages 481-489.
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Way Kuo, Kyungmee Kim & Taeho Kim. 2006. Springer Handbook of Engineering Statistics. Springer Handbook of Engineering Statistics 153 169 .
KYUNGMEE O. KIM & WAY KUO. (2011) TWO-LEVEL BURN-IN FOR RELIABILITY AND ECONOMY IN REPAIRABLE SERIES SYSTEMS HAVING INCOMPATIBILITY. International Journal of Reliability, Quality and Safety Engineering 11:03, pages 197-211.
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Kyungmee O. Kim & Way Kuo. (2003) A general model of heterogeneous system lifetimes and conditions for system burn‐in. Naval Research Logistics (NRL) 50:4, pages 364-380.
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Henry W. Block & Thomas H. Savits. (1997) Burn-In. Statistical Science 12:1.
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Wei-Ting Kary Chien & Way Kuo. (1996) A nonparametric approach to estimate system burn-in time. IEEE Transactions on Semiconductor Manufacturing 9:3, pages 461-467.
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Edward A. Pohl & Duane L. Dietrich. (1995) Environmental stress screening strategies for complex systems: A 3-level mixed distribution model. Microelectronics Reliability 35:4, pages 637-656.
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E.A. Pohl & D.L. Dietrich. (1995) Environmental stress screening strategies for multi-component systems with Weibull failure-times and imperfect failure detection. Environmental stress screening strategies for multi-component systems with Weibull failure-times and imperfect failure detection.
Wei-Ting Kary Chien & Way Kuo. (1994) Use of the dirichlet process for reliability analysis. Computers & Industrial Engineering 27:1-4, pages 339-343.
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Way Kuo, J.C. Fu, W.Y. Lou & F.K. Hwang. (1994) Opinions on consecutive-k-out-of-n:F systems. IEEE Transactions on Reliability 43:4, pages 659-662.
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