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ORIGINAL ARTICLES

Sequential measurement strategy for wafer geometric profile estimation

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Pages 1-12 | Received 01 Apr 2010, Accepted 01 Dec 2010, Published online: 07 Nov 2011

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Ning Ding, Zhen He, Shuguang He & Lisha Song. (2024) Real-time profile monitoring schemes considering covariates using Gaussian process via sensor data. Quality Technology & Quantitative Management 21:1, pages 35-53.
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Chen Zhang, Yong Lei, Linmiao Zhang & Nan Chen. (2017) Modeling tunnel profile in the presence of coordinate errors: A Gaussian process-based approach. IISE Transactions 49:11, pages 1065-1077.
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Linmiao Zhang, Kaibo Wang & Nan Chen. (2016) Monitoring wafers’ geometric quality using an additive Gaussian process model. IIE Transactions 48:1, pages 1-15.
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V. Roshan Joseph, Tirthankar Dasgupta, Rui Tuo & C. F. Jeff Wu. (2015) Sequential Exploration of Complex Surfaces Using Minimum Energy Designs. Technometrics 57:1, pages 64-74.
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Andi Wang, Kaibo Wang & Fugee Tsung. (2014) Statistical Surface Monitoring by Spatial-Structure Modeling. Journal of Quality Technology 46:4, pages 359-376.
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Lulu Bao, Kaibo Wang & Ran Jin. (2014) A hierarchical model for characterising spatial wafer variations. International Journal of Production Research 52:6, pages 1827-1842.
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Articles from other publishers (17)

Geet Lahoti, Chitta Ranjan, Jialei Chen, Hao Yan & Chuck Zhang. (2023) Convolutional Neural Network-Assisted Adaptive Sampling for Sparse Feature Detection in Image and Video Data. IEEE Intelligent Systems 38:1, pages 45-57.
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Bing Yao, Yun Chen & Hui Yang. (2022) Constrained Markov Decision Process Modeling for Optimal Sensing of Cardiac Events in Mobile Health. IEEE Transactions on Automation Science and Engineering 19:2, pages 1017-1029.
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Yuhang Yang, Varun A. Kelkar, Hemangg S. Rajput, Adriana C. Salazar Coariti, Kimani C. ToussaintJrJr & Chenhui Shao. (2022) Machine-learning-enabled geometric compliance improvement in two-photon lithography without hardware modifications. Journal of Manufacturing Processes 76, pages 841-849.
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Zhaohui Geng & Bopaya Bidanda. (2021) Geometric precision analysis for Additive Manufacturing processes: A comparative study. Precision Engineering 69, pages 68-76.
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Yuhang Yang, Zhiqiao Dong, Yuquan Meng & Chenhui Shao. (2021) Data-Driven Intelligent 3D Surface Measurement in Smart Manufacturing: Review and Outlook. Machines 9:1, pages 13.
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Xiaowei Yue, Yuchen Wen, Jeffrey H. Hunt & Jianjun Shi. (2021) Active Learning for Gaussian Process Considering Uncertainties With Application to Shape Control of Composite Fuselage. IEEE Transactions on Automation Science and Engineering 18:1, pages 36-46.
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Zhenguo Gao, Pang Du, Ran Jin & John L. Robertson. (2020) Surface temperature monitoring in liver procurement via functional variance change-point analysis. The Annals of Applied Statistics 14:1.
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Yuhang Yang, Yifang Zhang, Y. Dora Cai, Qiyue Lu, Seid Koric & Chenhui Shao. (2019) Hierarchical measurement strategy for cost-effective interpolation of spatiotemporal data in manufacturing. Journal of Manufacturing Systems 53, pages 159-168.
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Namjung Kim, Chen Yang, Howon Lee & Narayana Aluru. (2019) Spatial Uncertainty Modeling for Surface Roughness of Additively Manufactured Microstructures via Image Segmentation. Applied Sciences 9:6, pages 1093.
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Jie Ren & Hui Wang. (2019) Surface Variation Modeling by Fusing Multiresolution Spatially Nonstationary Data Under a Transfer Learning Framework. Journal of Manufacturing Science and Engineering 141:1.
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Sean McLoone, Adrian Johnston & Gian Antonio Susto. (2018) A Methodology for Efficient Dynamic Spatial Sampling and Reconstruction of Wafer Profiles. IEEE Transactions on Automation Science and Engineering 15:4, pages 1692-1703.
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Jia Peter Liu, Ran Jin & Zhenyu James Kong. (2018) Wafer quality monitoring using spatial Dirichlet process based mixed-effect profile modeling scheme. Journal of Manufacturing Systems 48, pages 21-32.
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Jie Ren, Chiwoo Park & Hui Wang. (2018) Stochastic Modeling and Diagnosis of Leak Areas for Surface Assembly. Journal of Manufacturing Science and Engineering 140:4.
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Gian Antonio Susto, Marco Maggipinto, Federico Zocco & Sean McLoone. (2018) A Dynamic Sampling Approach for Cost Reduction in Semiconductor Manufacturing. Procedia Manufacturing 17, pages 1031-1038.
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Chenhui Shao, Jionghua (Judy) Jin & S. Jack Hu. (2017) Dynamic Sampling Design for Characterizing Spatiotemporal Processes in Manufacturing. Journal of Manufacturing Science and Engineering 139:10.
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Hongyue Sun, Shuai Luo, Ran Jin & Zhen He. (2015) Multitask Lasso Model for Investigating Multimodule Design Factors, Operational Factors, and Covariates in Tubular Microbial Fuel Cells. ACS Sustainable Chemistry & Engineering 3:12, pages 3231-3238.
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Linmiao Zhang, Yong Lei & Nan Chen. (2015) Modeling tunnel profile using Gaussian process. Modeling tunnel profile using Gaussian process.

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