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Original Articles

Monitoring wafers’ geometric quality using an additive Gaussian process model

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Pages 1-15 | Received 31 Mar 2013, Accepted 27 Feb 2015, Published online: 17 Jul 2015

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Bing Yao, Farhad Imani & Hui Yang. (2018) Markov Decision Process for Image-Guided Additive Manufacturing. IEEE Robotics and Automation Letters 3:4, pages 2792-2798.
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Jia Peter Liu, Ran Jin & Zhenyu James Kong. (2018) Wafer quality monitoring using spatial Dirichlet process based mixed-effect profile modeling scheme. Journal of Manufacturing Systems 48, pages 21-32.
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Youyi Cai, Wenming Zheng, Tong Zhang, Qiang Li, Zhen Cui & Jiayin Ye. 2016. Pattern Recognition. Pattern Recognition 679 691 .
Chen Kan & Hui Yang. (2015) Network models for monitoring high-dimensional image profiles. Network models for monitoring high-dimensional image profiles.

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