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Quality Engineering Volume 8, 1996 - Issue 3
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Original Articles

Designing Quality (Yield) and Reliability into Circuits

Menberu Lulu Industrial and Systems Engineering Department, Florida International University, Miami, Florida 33199View further author information
Pages 383-393 | Published online: 22 Jan 2007

Citations (3)

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Read on this site (2)

Menberu Lulu & Saeed Maghsoodloo. (2003) Analytically Unobservable Failure Events. Quality Engineering 16:2, pages 283-288.
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Menberu Lulu. (2003) Characterizing Performance Variation of Product Designs. Quality Engineering 16:1, pages 105-111.
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Articles from other publishers (1)

Mohammad Masum Hossain, Sudhakar G. Jagarkal, Dereje Agonafer, Menberu Lulu & Stefan Reh. (2007) Design Optimization and Reliability of PWB Level Electronic Package. Journal of Electronic Packaging 129:1, pages 9-18.
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