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Original Articles

A NEW APPROACH TO PROCESS CAPABILITY ANALYSIS

Pages 205-211 | Published online: 19 Oct 2007

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Read on this site (5)

Alan M. Polansky. (2014) Assessing the Capability of a Manufacturing Process Using Nonparametric Bayesian Density Estimation. Journal of Quality Technology 46:2, pages 150-170.
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Samuel Kotz & Norman L. Johnson. (2002) Process Capability Indices—A Review, 1992–2000. Journal of Quality Technology 34:1, pages 2-19.
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Alan M Polansky. (2001) A Smooth Nonparametric Approach to Multivariate Process Capability. Technometrics 43:2, pages 199-211.
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JohnJ. Flaig. (1999) PROCESS CAPABILITY SENSITIVITY ANALYSIS. Quality Engineering 11:4, pages 587-592.
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AlanM. Polansky, Youn-Min Chou & RobertL. Mason. (1998) ESTIMATING PROCESS CAPABILITY INDICES FOR A TRLTNCATED DISTRIBUTION. Quality Engineering 11:2, pages 257-265.
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Articles from other publishers (8)

Alan M. Polansky. 2014. Wiley StatsRef: Statistics Reference Online. Wiley StatsRef: Statistics Reference Online.
Young Soon Chang & Do Sun Bai. 2014. Wiley StatsRef: Statistics Reference Online. Wiley StatsRef: Statistics Reference Online.
Banu Yuksel Ozkaya & Murat Caner Testik. (2010) On the expected parts per million nonconforming levels obtained from estimated process capability indices. Quality and Reliability Engineering International 26:8, pages 817-829.
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Alan M. Polansky. 2007. Encyclopedia of Statistics in Quality and Reliability. Encyclopedia of Statistics in Quality and Reliability.
Young Soon Chang & Do Sun Bai. 2007. Encyclopedia of Statistics in Quality and Reliability. Encyclopedia of Statistics in Quality and Reliability.
Alan M. Polansky & S.N.U.A. Kirmani. 2003. Statistics in Industry. Statistics in Industry 625 656 .
Young Soon Chang, In Su Choi & Do Sun Bai. (2002) Process capability indices for skewed populations. Quality and Reliability Engineering International 18:5, pages 383-393.
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Wagner de Souza Borges & Linda Lee Ho. (2001) A fraction defective based capability index. Quality and Reliability Engineering International 17:6, pages 447-458.
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