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Quality Engineering Volume 11, 1998 - Issue 2
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Original Articles

ESTIMATING PROCESS CAPABILITY INDICES FOR A TRLTNCATED DISTRIBUTION

Alan M. Polansky Northern Illinois University, DeKalb, Illinois 60115-2854
,
Youn-Min Chou The University of Texas at San Antonio, San Antonio, Texas 78249-0664
&
Robert L. Mason Northern Illinois University, DeKalb, Illinois 60115-2854
Pages 257-265 | Published online: 19 Oct 2007

Citations (13)

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Read on this site (5)

CynthiaR. Lovelace & JamesJ. Swain. (2009) Process Capability Analysis Methodologies for Zero-Bound, Non-Normal Process Data. Quality Engineering 21:2, pages 190-202.
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Surajit Pal. (2004) Evaluation of Nonnormal Process Capability Indices using Generalized Lambda Distribution. Quality Engineering 17:1, pages 77-85.
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Samuel Kotz & Norman L. Johnson. (2002) Process Capability Indices—A Review, 1992–2000. Journal of Quality Technology 34:1, pages 2-19.
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Alan M Polansky. (2001) A Smooth Nonparametric Approach to Multivariate Process Capability. Technometrics 43:2, pages 199-211.
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Alan M. Polansky. (2000) An Algorithm for Computing a Smooth Nonparametric Process Capability Estimate. Journal of Quality Technology 32:3, pages 284-289.
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Articles from other publishers (8)

Riccardo Borgoni & Diego Zappa. (2020) Model‐based process capability indices: The dry‐etching semiconductor case study. Quality and Reliability Engineering International 36:7, pages 2309-2321.
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Yanhe Cui, Jun Yang & Shuo Huang. (2018) Interval Estimation of Process Capability Indices Based on the Quality Data of Supplied Products. Interval Estimation of Process Capability Indices Based on the Quality Data of Supplied Products.
Anintaya Khamkanya, Byung Rae Cho & Paul L. Goethals. (2016) Integrating Customer Perception into Process Capability Measures. Quality and Reliability Engineering International 32:4, pages 1331-1345.
Crossref
Youn‐Min Chou & Alan M. Polansky. 2014. Wiley StatsRef: Statistics Reference Online. Wiley StatsRef: Statistics Reference Online.
Tao Liang & Xinzhang Jia. (2012) An empirical formula for yield estimation from singly truncated performance data of qualified semiconductor devices. Journal of Semiconductors 33:12, pages 125008.
Crossref
Mohammed Z. Anis. (2008) Basic Process Capability Indices: An Expository Review. International Statistical Review 76:3, pages 347-367.
Crossref
Youn‐Min Chou & Alan M. Polansky. 2007. Encyclopedia of Statistics in Quality and Reliability. Encyclopedia of Statistics in Quality and Reliability.
Alan M. Polansky & S.N.U.A. Kirmani. 2003. Statistics in Industry. Statistics in Industry 625 656 .

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