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Journal of Modern Optics Volume 44, 1997 - Issue 3
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Paper

Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry

Patrick Sandoz Laboratoire d'Optique P. M. Duffieux, Unité de Recherche associée au CNRS 214, Université de Franche-Comté, 16 route de Gray, 25030, Besançon Cedex, France
,
Robert Devillers Laboratoire d'Optique P. M. Duffieux, Unité de Recherche associée au CNRS 214, Université de Franche-Comté, 16 route de Gray, 25030, Besançon Cedex, France
&
Arturo Plata Laboratoire d'Optique P. M. Duffieux, Unité de Recherche associée au CNRS 214, Université de Franche-Comté, 16 route de Gray, 25030, Besançon Cedex, France
Pages 519-534 | Received 24 Jun 1996, Published online: 03 Jul 2009

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Alexandra Plata Planidina, Carolina Mendoza Luna, Jáder Enrique Guerrero Bermúdez & Arturo Plata Gómez. (2023) Profilometry by zero-order interference fringe identification in the Commission Internationale de l’Eclairage system. Journal of Modern Optics 70:7, pages 449-455.
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R. Windecker, M. Fleischer & H.J. Tiziani. (1999) White-light interferometry with an extended zoom range. Journal of Modern Optics 46:7, pages 1123-1135.
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S. Suja Helen, M.P. Kothiyal & R.S. Sirohi. (1999) Phase shifting by a rotating polarizer in white-light interferometry for surface profiling. Journal of Modern Optics 46:6, pages 993-1001.
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Patrick Sandoz, Jose Calatroni & Gilbert Tribillon. (1999) Potential of a wavelength sampling approach for profilometry by phase shifting interferometry. Journal of Modern Optics 46:2, pages 327-339.
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