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Journal of Modern Optics Volume 46, 1999 - Issue 14
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Optical quantities of multilayer systems with correlated randomly rough boundaries

Ivan Ohlídal Department of Solid State Physics, Faculty of Science, Masaryk University, Kotlářská 2, 611 37, Brno, Czech Republic
&
František Vižďa Department of Physics, Military Academy, Kounicova 65, 612 00, Brno, Czech Republic
Pages 2043-2062 | Received 21 Dec 1998, Published online: 03 Jul 2009

Citations (6)

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Read on this site (2)

Saddek Afifi, Richard Dusséaux & Rodrigo de Oliveira. (2010) Statistical distribution of the field scattered by rough layered interfaces: formulae derived from the small perturbation method. Waves in Random and Complex Media 20:1, pages 1-22.
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Martin Šiler, Ivan Ohlídal, Daniel Franta, Alberto Montaigne Ramil, Alberta Bonanni, David Stifter & Helmut Sitter. (2005) Optical characterization of double layers containing epitaxial ZnSe and ZnTe films. Journal of Modern Optics 52:4, pages 583-602.
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Articles from other publishers (4)

Ivan Ohlídal, Martin Čermák & Jiří Vohánka. 2018. Optical Characterization of Thin Solid Films. Optical Characterization of Thin Solid Films 271 313 .
Ivan Ohlídal, Daniel Franta & David Nečas. (2017) Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness. Applied Surface Science 421, pages 687-696.
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D Nečas, I Ohlídal, D Franta, M Ohlídal & J Vodák. (2016) Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry. Journal of Optics 18:1, pages 015401.
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David Nečas & Ivan Ohlídal. (2014) Consolidated series for efficient calculation of the reflection and transmission in rough multilayers. Optics Express 22:4, pages 4499.
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