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Philosophical Magazine Letters Volume 85, 2005 - Issue 1
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Original Articles

Measurements of potential barrier height of grain boundaries in polycrystalline silicon by Kelvin probe force microscopy

S. Tsurekawa *
,
K. Kido
&
T. Watanabe
Pages 41-49 | Received 07 Feb 2005, Accepted 26 Apr 2005, Published online: 17 Aug 2006

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Sadahiro Tsurekawa, Hiroaki Takahashi, Yumi Nishibe & Tadao Watanabe. (2013) Potential barrier at grain boundaries in polycrystalline silicon: influence of grain-boundary character and copper/iron contamination. Philosophical Magazine 93:10-12, pages 1413-1424.
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Articles from other publishers (43)

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Aref Samadi, Alison Ciesla, Catherine Chan & Mattias Juhl. (2022) Implications of grain boundaries on quasi-steady-state photoconductance measurements in multicrystalline and cast-mono silicon. Solar Energy Materials and Solar Cells 238, pages 111639.
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Woo Hyun Nam, Ju Hyoung Sun, Hae Won Lee, Na Won Kim & Young Soo Lim. (2021) Significantly enhanced charge transport in polysilicon by alleviating grain boundary scattering through interface control using reduced graphene oxide. Journal of the Korean Ceramic Society 59:2, pages 263-269.
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Chisato Sakaguchi, Yasumasa Nara, Takeshi Hashishin, Hiroya Abe, Motohide Matsuda, Sadahiro Tsurekawa & Hiroshi Kubota. (2020) Direct observation of potential phase at joining interface between p-MgO and n-MgFe2O4. Scientific Reports 10:1.
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A. S. Ilin, V. M. Gololobov, E. A. Forsh, P. A. Forsh & P. K. Kashkarov. (2020) Prediction of Potential Barrier at Crystallite Boundaries in Poly- and Nanocrystalline Semiconductors. Russian Microelectronics 48:8, pages 576-581.
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A. S. Ilin, V. M. Gololobov, E. A. Forsh, P. A. Forsh & P. K. Kashkarov. (2019) Calculation of the grain potential barrier in the poly− and nanocrystalline semiconductors. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering 20:2, pages 122-128.
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Thi Thuy Nguyen & Shin-Ichiro Kuroki. (2019) Dependence of thin film transistor characteristics on low-angle grain boundaries of (100)-oriented polycrystalline silicon thin films. Japanese Journal of Applied Physics 58:SB, pages SBBJ08.
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Paola Cristina Cajas Daza, Rodrigo Arbey Muñoz Meneses, Ana Candida Martins Rodrigues & Cosme Roberto Moreira da Silva. (2018) Ionic conductivities and high resolution microscopic evaluation of grain and grain boundaries of cerium-based codoped solid electrolytes. Ceramics International 44:12, pages 13699-13705.
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Takanori Asano, Riichiro Takaishi, Minoru Oda, Kiwamu Sakuma, Masumi Saitoh & Hiroki Tanaka. (2018) Individual analysis of inter and intragrain defects in electrically characterized polycrystalline silicon nanowire TFTs by multicomponent dark-field imaging based on nanobeam electron diffraction two-dimensional mapping. Japanese Journal of Applied Physics 57:4S, pages 04FD20.
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Takashi Suemasu & Noritaka Usami. (2017) Exploring the potential of semiconducting BaSi 2 for thin-film solar cell applications . Journal of Physics D: Applied Physics 50:2, pages 023001.
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Jeong In Jang, Ji Eun Lee, Bong-Seo Kim, Su-Dong Park & Ho Seong Lee. (2017) Twinning and its formation mechanism in a binary Mg 2 Si thermoelectric material with an anti-fluorite structure . RSC Advances 7:35, pages 21671-21677.
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Jian Zhang, Ziyu Qin, Dawen Zeng & Changsheng Xie. (2017) Metal-oxide-semiconductor based gas sensors: screening, preparation, and integration. Physical Chemistry Chemical Physics 19:9, pages 6313-6329.
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Shigeaki Kobayashi, Sadahiro Tsurekawa & Tadao Watanabe. (2016) A new approach to grain boundary engineering for nanocrystalline materials. Beilstein Journal of Nanotechnology 7, pages 1829-1849.
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J. Yun, J. Huang, A. Teal, K. Kim, S. Varlamov & M.A. Green. (2016) Correlation of the crystal orientation and electrical properties of silicon thin films on glass crystallized by line focus diode laser. Thin Solid Films 609, pages 12-18.
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Piu Rajak, Sung Bo Lee & Somnath Bhattacharyya. (2015) Indication of thermal roughening in the retrieved mean inner potential across a Σ5 grain boundary in SrTiO3 annealed at different temperatures. Journal of Materials Science 51:3, pages 1484-1489.
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Assaf Shamir, Iddo Amit, Danny Englander, Dror Horvitz & Yossi Rosenwaks. (2015) Potential barrier height at the grain boundaries of a poly-silicon nanowire. Nanotechnology 26:35, pages 355201.
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S. Kühnapfel, S. Gall, B. Rech & D. Amkreutz. (2015) Towards monocrystalline silicon thin films grown on glass by liquid phase crystallization. Solar Energy Materials and Solar Cells 140, pages 86-91.
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S. Kühnapfel, N.H. Nickel, S. Gall, M. Klaus, C. Genzel, B. Rech & D. Amkreutz. (2015) Preferential {100} grain orientation in 10 micrometer-thick laser crystallized multicrystalline silicon on glass. Thin Solid Films 576, pages 68-74.
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Masakazu Baba, Kosuke O. Hara, Daichi Tsukahara, Kaoru Toko, Noritaka Usami, Takashi Sekiguchi & Takashi Suemasu. (2014) Potential variation around grain boundaries in BaSi2 films grown on multicrystalline silicon evaluated using Kelvin probe force microscopy. Journal of Applied Physics 116:23.
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D. Tsukahara, M. Baba, S. Honda, Y. Imai, K. O. Hara, N. Usami, K. Toko, J. H. Werner & T. Suemasu. (2014) Potential variations around grain boundaries in impurity-doped BaSi2 epitaxial films evaluated by Kelvin probe force microscopy. Journal of Applied Physics 116:12.
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Norihito Sakaguchi. (2014) Analysis of Atomic and Electronic Structures on CSL Boundary in Silicon. Journal of the Japan Institute of Metals and Materials 78:1, pages 1-6.
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Clayton W. BatesJr.Jr. & Chichang Zhang. (2013) Electronic transport in heavily doped Ag/n-Si composite films. AIP Advances 3:10.
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Masakazu Baba, Sadahiro Tsurekawa, Kentaro Watanabe, W. Du, Kaoru Toko, Kosuke O. Hara, Noritaka Usami, Takashi Sekiguchi & Takashi Suemasu. (2013) Evaluation of potential variations around grain boundaries in BaSi2 epitaxial films by Kelvin probe force microscopy. Applied Physics Letters 103:14.
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J.L. Cui, Y.Y. Li, Y. Deng, Q.S. Meng, Y.L. Gao, H. Zhou & Y.P. Li. (2012) Microstructure modulation responsible for the improvement in thermoelectric property of a wide-gap AgIn5Se8 semiconductor. Intermetallics 31, pages 217-224.
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D. L. Medlin & N. Y. C. Yang. (2011) Interfacial Step Structure at a (0001) Basal Twin in Bi2Te3. Journal of Electronic Materials 41:6, pages 1456-1464.
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Kenji Hara & Takuji Takahashi. (2012) Photothermal Signal and Surface Potential around Grain Boundaries in Multicrystalline Silicon Solar Cells Investigated by Scanning Probe Microscopy. Applied Physics Express 5:2, pages 022301.
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Hiroyuki Matsui, Daisuke Kumaki, Eiji Takahashi, Kazuo Takimiya, Shizuo Tokito & Tatsuo Hasegawa. (2012) Correlation between interdomain carrier hopping and apparent mobility in polycrystalline organic transistors as investigated by electron spin resonance. Physical Review B 85:3.
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Tadao Watanabe, Shigeaki Kobayashi, Xiang Zhao & Liang Zuo. (2011) Importance of Microscale Texture and Grain Boundary Connectivity to Percolation-Dependent Bulk Properties in Polycrystalline Materials. Materials Science Forum 702-703, pages 703-709.
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Takuji Takahashi. (2011) Photoassisted Kelvin Probe Force Microscopy on Multicrystalline Si Solar Cell Materials. Japanese Journal of Applied Physics 50:8S3, pages 08LA05.
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Takuji Takahashi. (2011) Photoassisted Kelvin Probe Force Microscopy on Multicrystalline Si Solar Cell Materials. Japanese Journal of Applied Physics 50:8, pages 08LA05.
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Tadao Watanabe. (2011) Grain boundary engineering: historical perspective and future prospects. Journal of Materials Science 46:12, pages 4095-4115.
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Norihito Sakaguchi, Makito Miyake, Seiichi Watanabe & Heishichiro Takahashi. (2011) EELS and <I>Ab-Initio</I> Study of Faceted CSL Boundary in Silicon. MATERIALS TRANSACTIONS 52:3, pages 276-279.
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D. L. Medlin, Q. M. Ramasse, C. D. Spataru & N. Y. C. Yang. (2010) Structure of the (0001) basal twin boundary in Bi2Te3. Journal of Applied Physics 108:4.
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Nikolay Nakhodkin, Nikolay Kulish & Tatyana Rodionova. (2010) Faceting of twin grain boundaries in polysilicon films. physica status solidi (a) 207:2, pages 316-320.
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Masaki Takihara, Takuji Takahashi & Toru Ujihara. (2009) Study of minority carrier diffusion length in multicrystalline silicon solar cells using photoassisted Kelvin probe force microscopy. Applied Physics Letters 95:19.
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Tadao Watanabe, Sadahiro Tsurekawa, Xiang Zhao & Liang Zuo. 2009. Microstructure and Texture in Steels. Microstructure and Texture in Steels 43 82 .
Jihua Chen, Chee Keong Tee, Max Shtein, John Anthony & David C. Martin. (2008) Grain-boundary-limited charge transport in solution-processed 6,13 bis(tri-isopropylsilylethynyl) pentacene thin film transistors. Journal of Applied Physics 103:11, pages 114513.
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Sadahiro Tsurekawa, Kota Kido & Tadao Watanabe. (2007) Interfacial state and potential barrier height associated with grain boundaries in polycrystalline silicon. Materials Science and Engineering: A 462:1-2, pages 61-67.
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