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Philosophical Magazine Letters Volume 58, 1988 - Issue 1
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Original Articles

Convergent-beam electron diffraction from AlGaAs/GaAs single quantum wells

D. Cherns H. H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol, BS8 1TL, England
,
I. K. Jordan H. H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol, BS8 1TL, England
&
R. Vincent H. H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol, BS8 1TL, England
Pages 45-51 | Received 21 Apr 1988, Accepted 25 Apr 1988, Published online: 20 Nov 2006

Citations (11)

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N. Grigorieff, D. Cherns, M.J. Yates, M. Hockly, S.D. Perrin & M.R. Aylett. (1993) Electron microscopy of ultra-thin buried layers in InP and InGaAs. Philosophical Magazine A 68:1, pages 121-136.
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P.A. Midgley, R. Vincent & D. Cherns. (1992) {110} twinning in YBa2Cu3O7-x . Philosophical Magazine A 66:2, pages 237-256.
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Articles from other publishers (9)

ZIPPRICH, FÜLLER, BANHART, SCHMIDT & EBERL. (1999) The quantitative characterization of SiGe layers by analysing rocking profiles in CBED patterns. Journal of Microscopy 194:1, pages 12-20.
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Ludwig ReimerLudwig Reimer. 1997. Transmission Electron Microscopy. Transmission Electron Microscopy 331 361 .
. (1997) Probing semiconductor interfaces by transmission electron microscopy. Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences 344:1673, pages 545-556.
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I.K. Jordan, C.J. Rossouw & R. Vincent. (1991) Effects of energy filtering in LACBED patterns. Ultramicroscopy 35:3-4, pages 237-243.
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C.J. Rossouw, M. AL-Khafaji, D. Cherns, J.W. Steeds & R. Touaitia. (1991) A treatment of dynamical diffraction for multiply layered structures. Ultramicroscopy 35:3-4, pages 229-236.
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E. G. Bithell & W. M. Stobbs. (1991) III-V ternary semiconductor heterostructures: The choice of an appropriate compositional analysis technique. Journal of Applied Physics 69:4, pages 2149-2155.
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Changmo Sung & David B. Williams. (2005) Principles and applications of convergent beam electron diffraction: A bibliography (1938‐1990). Journal of Electron Microscopy Technique 17:1, pages 95-118.
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D. Cherns & A. R. Preston. (2005) Convergent beam diffraction studies of interfaces, defects, and multilayers. Journal of Electron Microscopy Technique 13:2, pages 111-122.
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D. Cherns. 1990. Evaluation of Advanced Semiconductor Materials by Electron Microscopy. Evaluation of Advanced Semiconductor Materials by Electron Microscopy 59 74 .

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