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Journal of the Chinese Institute of Industrial Engineers Volume 18, 2001 - Issue 6
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Original Articles

A CUSUM CONTROL SCHEME FOR CLUSTERED DEFECTS

Chuen-Sheng Cheng Department of Industrial Engineering and Management, Yuan-Ze University, 135, Yuan-Tung Road, Chungli, Taoyuan, Taiwan, 320, R.O.C.
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Sheng-Su Cheng Department of Industrial Engineering and Management, Yuan-Ze University, 135, Yuan-Tung Road, Chungli, Taoyuan, Taiwan, 320, R.O.C.
Pages 1-8 | Received 01 Dec 1999, Accepted 01 Mar 2000, Published online: 17 Feb 2010

Citations (4)

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Read on this site (1)

Sheng-Shu Cheng, Fong-Jung Yu & Steve Hsueh Ming Wang. (2014) A CUSUM Control Chart to Monitor Wafer Production Quality. Journal of Information and Optimization Sciences 35:5-6, pages 483-501.
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Articles from other publishers (3)

Aamir Saghir & Zhengyan Lin. (2015) Control Charts for Dispersed Count Data: An Overview. Quality and Reliability Engineering International 31:5, pages 725-739.
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Aamir Saghir & Zhengyan Lin. (2015) The Negative Binomial Exponentially Weighted Moving Average Chart with Estimated Control Limits. Quality and Reliability Engineering International 31:2, pages 239-250.
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Fong-Jung Yu, Yung-Yu Yang, Ming-Jaan Wang & Zhang Wu. (2011) Using EWMA control schemes for monitoring wafer quality in negative binomial process. Microelectronics Reliability 51:2, pages 400-405.
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