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Articles

Dielectric properties of UV-irradiated ultrathin polysulfone films revealed by surface plasmon resonance method

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Pages 396-402 | Received 04 Mar 2018, Accepted 18 Mar 2018, Published online: 11 Apr 2018

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Roman Pogreb, Roman Grynyov, Oz Ben-Yosef & Gene Whyman. (2021) Simultaneous determination of thickness and refractive index using Cauchy or Sellmeier formulas by the example of surface plasmon resonance study on ultrathin polysulfone film. International Journal of Polymer Analysis and Characterization 26:8, pages 661-667.
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Roman Pogreb, Victor Danchuk & Gene Whyman. (2018) Influence of UV irradiation in nitrogen and air environment on dielectric properties of ultrathin polysulfone films revealed using surface plasmon resonance method. International Journal of Polymer Analysis and Characterization 23:7, pages 669-674.
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