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Original Articles

Anwendung der Neutronenaktivierungsanalyse zur Untersuchung von Konzentrationaprofilen in Silizium

Pages 41-47 | Published online: 09 Sep 2008

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Read on this site (2)

S. Niese. (1980) Diffusion von Kupfer in Silicium während der Neutronenaktivierung. Isotopenpraxis Isotopes in Environmental and Health Studies 16:12, pages 399-402.
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W. Heinze & M. Kahl. (1975) Mathematisch-Statistche Auswertung der Ergebnisse von Neutronenaktivierungsanalysen zur Ermittlung von Konzentrationsprofilen in Silizium. Isotopenpraxis Isotopes in Environmental and Health Studies 11:6, pages 210-215.
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Articles from other publishers (6)

H. Förster. (1982) The radioanalytical bibliography of GDR (1959–1979). Journal of Radioanalytical Chemistry 73:2, pages 341-391.
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H. Jaskólska, L. Rowińska & L. Waliś. (1977) Application of neutron activation analysis for the determination of implantation profiles of phosphorus in semiconductor grade silicon. Journal of Radioanalytical Chemistry 38:1-2, pages 29-35.
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S. Niese. (1975) Aktivierungsanalytische Bestimmung Extrem Niedriger Elementkonzentrationen in Reinsten Stoffen. Journal of Radioanalytical Chemistry 28:1-2, pages 171-184.
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H. Jaskólska & L. Rowińska. (1975) Determination of phosphorus in semiconductor grade silicon by neutron activation analysis. Journal of Radioanalytical Chemistry 26:1, pages 31-37.
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J. Lorenzen, D. Brune & S. Malmskog. (1973) Depth distribution of light elements in heavy matrices with charged-particle-induced reactions. Journal of Radioanalytical Chemistry 16:2, pages 483-492.
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W. Bock-Werthmann, B. Sansoni & E. Bujdosó. (1973) Bibliography section. Journal of Radioanalytical Chemistry 14:2, pages 461-482.
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