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Radiation Effects and Defects in Solids
Incorporating Plasma Science and Plasma Technology
Volume 174, 2019 - Issue 7-8
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Articles

Defects induced by gamma-ray irradiation and post-irradiation annealing and its influence on the threshold voltage of p-channel power VDMOS transistors

Milic M. PejovicFaculty of Electronic Engineering, University of Nis, Nis, SerbiaCorrespondence[email protected]
Pages 567-578 | Received 26 Nov 2018, Accepted 21 Apr 2019, Published online: 04 Jun 2019

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