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Integrated Ferroelectrics
An International Journal
Volume 65, 2004 - Issue 1
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Original Articles

Ferroelectric Characteristics of the Mod-Derived SrxBi2.4(Ta0.75Nb0.25)2O9 Thin Films and Electrical Properties of the Pt/SrxBi2.4(Ta0.75Nb0.25)2O9/TiO2/Si Structure

J. H. PARK Department of Material Science and Engineering, Hongik University, Seoul, Korea, 121-791
,
J. H. CHOI Department of Material Science and Engineering, Hongik University, Seoul, Korea, 121-791
,
K. Y. LEE Department of Material Science and Engineering, Hongik University, Seoul, Korea, 121-791
&
T. S. OH Department of Material Science and Engineering, Hongik University, Seoul, Korea, 121-791
Pages 81-88 | Received 01 May 2004, Accepted 01 Aug 2004, Published online: 11 Aug 2010

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