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Integrated Ferroelectrics
An International Journal
Volume 1, 1992 - Issue 1
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Original Articles

The dependence of ferroelectric and fatigue behaviors of PZT films on microstructure and orientation

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Pages 57-69 | Received 15 Dec 1991, Published online: 19 Aug 2006

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Read on this site (8)

Geun Jo Han, Cheol-Woong Yang & Jaichan Lee. (1999) Effect of (La, Sr)CoO3 seed layer on the reliability of Pb(Zr, Ti)O3 capacitors. Integrated Ferroelectrics 25:1-4, pages 341-350.
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Ilsub Chung, J.K. Lee, I.K. Yoo & SeshuB. Desu. (1995) Modification of PZT nucleation and growth using oxide layer in multi-layered electrodes. Integrated Ferroelectrics 10:1-4, pages 99-111.
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Giovanni Chiorboli, Giovanni Franco, Fabrizio Leccabue & Bernard Enrico Watts. (1995) Fatigue behaviour of ferroelectric thin films for nonvolatile memories. Integrated Ferroelectrics 8:1-2, pages 99-108.
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G. Teowee, C.D. Baertlein, E.A. Kneer, J.M. Boulton & D.R. Uhlmann. (1995) Effect of top metallization on the fatigue and retention properties of Sol-gel PZT thin films. Integrated Ferroelectrics 7:1-4, pages 149-160.
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Dong-Soo Paik, Joon-Han Kim, Hyung-Wook Choi, Hyun-Sang Yoon, Chang-Yub Park & Hyun-Yong Shin. (1995) Structural properties and effect of excess pb on pb(zr0.52ti0.48)o3 thin films prepared by sol-gel processing. Ferroelectrics 173:1, pages 213-220.
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K.A. Vorotilov, M.I. Yanovskaya & O.A. Dorokhova. (1993) Effect of annealing conditions on alkoxy-derived PZT thin films. Microstructural and CV study. Integrated Ferroelectrics 3:1, pages 33-49.
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S.A. Mansour, D.A. Binford & R.W. Vest. (1992) The dependence of ferroelectric and fatigue behaviors of PZT films on annealing conditions. Integrated Ferroelectrics 1:1, pages 43-56.
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Articles from other publishers (12)

C.R. Foschini, M.A. Ramirez, S.R. Simões, J.A. Varela, E. Longo & A.Z. Simões. (2013) Piezoresponse force microscopy characterization of rare-earth doped BiFeO3 thin films grown by the soft chemical method. Ceramics International 39:3, pages 2185-2195.
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Ming-Ming Zhang, Ze Jia & Tian-Ling Ren. (2009) Effects of electrodes on the properties of sol–gel PZT based capacitors in FeRAM. Solid-State Electronics 53:5, pages 473-477.
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X. J. Lou. (2009) Polarization fatigue in ferroelectric thin films and related materials. Journal of Applied Physics 105:2.
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Hiroshi Uchida, Risako Ueno, Hiroshi Funakubo & Seiichiro Koda. (2006) Crystal structure and ferroelectric properties of rare-earth substituted BiFeO3 thin films. Journal of Applied Physics 100:1.
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Mohamed Y. El-Naggar, David A. Boyd & David G. Goodwin. (2011) Characterization of Highly-Oriented Ferroelectric Pb x Ba 1−x TiO 3 Thin Films Grown by Metalorganic Chemical Vapor Deposition . Journal of Materials Research 20:11, pages 2969-2976.
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P. A. Shcheglov, S. A. Men’shikh, S. G. Prutchenko, L. F. Rybakova & Yu. Ya. Tomashpol’skii. (2000) Pb5Ge3O11 ferroelectric films prepared by a modified sol—gel method. Inorganic Materials 36:1, pages 67-71.
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Fan Chu, Glen Fox & Tom Davenport. (2011) Scaled PLZT Thin Film Capacitors with Excellent Endurance and Retention Performance. MRS Proceedings 655.
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H. N. Al-Shareef, B. A. Tuttle, W. L. Warren, T. J. Headley, D. Dimos, J. A. Voigt & R. D. Nasby. (1996) Effect of B -site cation stoichiometry on electrical fatigue of RuO2//Pb(Zr x Ti1− x )O3//RuO2 capacitors . Journal of Applied Physics 79:2, pages 1013-1016.
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Susan Trolier‐McKinstry, Jiayu Chen, Kuppuswami Vedam & Robert E. Newnham. (2005) In Situ Annealing Studies of Sol‐Gel Ferroelectric Thin Films by Spectroscopic Ellipsometry . Journal of the American Ceramic Society 78:7, pages 1907-1913.
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Said A. Mansour, Gerald L. Liedl & Robert W. Vest. (2005) Microstructural Developments and Dielectric Properties of Rapid Thermally Processed PZT Thin Films Derived by Metallo‐organic Decomposition. Journal of the American Ceramic Society 78:6, pages 1617-1623.
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Ilsub Chung, J.K. Lee, Wan In Lee & C.W. Chung. (2011) Study on Multilayered Electrodes for Ferroelectric Thin Film Capacitors. MRS Proceedings 361.
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V.R Iycr, E.P Kvam, D.L Pcrry, R Ramesh, T.D Sands & V Keramidas. (1993) Oriented growth in oxide thin film heterostructures. Scripta Metallurgica et Materialia 29:7, pages 885-888.
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