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Integrated Ferroelectrics
An International Journal
Volume 16, 1997 - Issue 1-4
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Device intergration issues and testing

The effects of ferroelectric capacitor testing methods on predicted imprint failure points

Robbert I. Suizu Radiant Technologies Inc., Albuquerque, New Mexico, USA
&
Scott P. Chapman Radiant Technologies Inc., Albuquerque, New Mexico, USA
Pages 87-96 | Received 18 Mar 1996, Published online: 19 Aug 2006

Citations (8)

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Read on this site (2)

R. Ramesh & S. Aggarwal. (1999) Guest editorial. Integrated Ferroelectrics 25:1-4, pages ix-xii.
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M. Grossmann, O. Lohse, D. Bolten, R. Waser, W. Hartner, G. Schindler, C. Dehm, N. Nagel, V. Joshi, N. Solayappan & G. Derbenwick. (1998) Imprint in ferroelectric SrBi2Ta2O9 capacitors for non-volatile memory applications. Integrated Ferroelectrics 22:1-4, pages 95-107.
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Articles from other publishers (6)

G. Muller, N. Nagel, C.-U. Pinnow & T. Rohr. (2003) Emerging non-volatile memory technologies. Emerging non-volatile memory technologies.
M. Grossmann, O. Lohse, D. Bolten, U. Boettger, R. Waser, W. Hartner, M. Kastner & G. Schindler. (2000) Lifetime estimation due to imprint failure in ferroelectric SrBi2Ta2O9 thin films. Applied Physics Letters 76:3, pages 363-365.
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S. Sadashivan, S. Aggarwal, T. K. Song, R. Ramesh, J. T. EvansJr.Jr., B. A. Tuttle, W. L. Warren & D. Dimos. (1998) Evaluation of imprint in fully integrated (La,Sr)CoO3/Pb(Nb,Zr,Ti)O3/(La,Sr)CoO3 ferroelectric capacitors. Journal of Applied Physics 83:4, pages 2165-2171.
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S. Aggarwal, T. K. Song, A. M. Dhote, A. S. Prakash, R. Ramesh, N. Velasquez, L. Boyer & J. T. EvansJr.Jr.. (1998) Influence of cationic stoichiometry of La1−xSrxCoO3 electrodes on the ferroelectric properties of lead based thin film memory elements. Journal of Applied Physics 83:3, pages 1617-1624.
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Dong-Joo Kim, Seung-Hyun Kim, Jon-Paul Maria & Angus I. Kingon. (2011) Thermally Induced Imprint of PZT and SBT Thin Films. MRS Proceedings 541.
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M. Grossmann, O. Lohse, D. Bolten, R. Waser, W. Hartner, G. Schindler, N. Nagel & C. Dehm. (2011) Origin of Imprint in Ferroelectric CSD SrBi 2 Ta 2 O 9 Thin Films . MRS Proceedings 541.
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